统计元件选择在三维集成AlN MEMS滤波器中的应用,用于性能校正和良率提高

A. Patterson, Enes Calayir, G. Fedder, G. Piazza, B. Soon, Navab Singh
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引用次数: 8

摘要

通过将12个表面上相同的AlN MEMS子滤波器阵列与CMOS开关矩阵进行3D集成,并将统计元件选择应用于同一系统,我们构建了一个自修复滤波器,提供495个独特的滤波器响应,中心频率和带宽的调谐范围为500 kHz。所演示的系统能够纠正固有的、制造引起的滤波器性能变化,否则这些变化将对独立滤波器的制造构成严重的产量限制。
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Application of statistical element selection to 3D integrated AlN MEMS filters for performance correction and yield enhancement
By 3D integration of an array of 12 nominally identical AlN MEMS sub-filters with a CMOS switching matrix and application of statistical element selection to the same system, we have built a self-healing filter offering 495 unique filter responses and a tuning range of 500 kHz for both center frequency and bandwidth. The demonstrated system enables correction of intrinsic, fabrication-induced variation in filter performance that would otherwise constitute a severe yield limitation to the manufacture of standalone filters.
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