{"title":"半导体制造的准时制方法","authors":"M. Levitt, J. Abraham","doi":"10.1109/ASMC.1990.111212","DOIUrl":null,"url":null,"abstract":"A method is presented that allows job shops, such as wafer fabrication lines (fabs), to be analyzed for the application of just-in-time (JIT) production methods. From the resources available and the process recipe, a Kanban policy is derived that allows a pull-type production system to be implemented. Using this method example fabs were analyzed and the JIT/Kanban policies derived were simulated. The simulations show that the proposed method performs very well compared to other fab scheduling policies.<<ETX>>","PeriodicalId":158760,"journal":{"name":"IEEE/SEMI Conference on Advanced Semiconductor Manufacturing Workshop","volume":"28 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"1990-09-11","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"11","resultStr":"{\"title\":\"Just-in-time methods for semiconductor manufacturing\",\"authors\":\"M. Levitt, J. Abraham\",\"doi\":\"10.1109/ASMC.1990.111212\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"A method is presented that allows job shops, such as wafer fabrication lines (fabs), to be analyzed for the application of just-in-time (JIT) production methods. From the resources available and the process recipe, a Kanban policy is derived that allows a pull-type production system to be implemented. Using this method example fabs were analyzed and the JIT/Kanban policies derived were simulated. The simulations show that the proposed method performs very well compared to other fab scheduling policies.<<ETX>>\",\"PeriodicalId\":158760,\"journal\":{\"name\":\"IEEE/SEMI Conference on Advanced Semiconductor Manufacturing Workshop\",\"volume\":\"28 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"1990-09-11\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"11\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"IEEE/SEMI Conference on Advanced Semiconductor Manufacturing Workshop\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/ASMC.1990.111212\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"IEEE/SEMI Conference on Advanced Semiconductor Manufacturing Workshop","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/ASMC.1990.111212","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
Just-in-time methods for semiconductor manufacturing
A method is presented that allows job shops, such as wafer fabrication lines (fabs), to be analyzed for the application of just-in-time (JIT) production methods. From the resources available and the process recipe, a Kanban policy is derived that allows a pull-type production system to be implemented. Using this method example fabs were analyzed and the JIT/Kanban policies derived were simulated. The simulations show that the proposed method performs very well compared to other fab scheduling policies.<>
京公网安备 11010802042870号
京ICP备2023020795号-1
分享
求助内容：
应助结果提醒方式：
扫码关注我们
