基于延迟链的可编程抖动发生器

T. Xia, P. Song, K. Jenkins, Jien-Chung Lo
{"title":"基于延迟链的可编程抖动发生器","authors":"T. Xia, P. Song, K. Jenkins, Jien-Chung Lo","doi":"10.1109/ETSYM.2004.1347578","DOIUrl":null,"url":null,"abstract":"In this paper, we presents a programmable jitter generator. Different from the traditional jitter generator that uses the analog phase modulation (PM) technique to generate only non-Gaussian distributed jitter components, the proposed jitter generator uses digital techniques. It consists of a voltage controlled delay chain, jitter control block, and some basic digital components. It can generate not only the non-Gaussian distributed jitter component, but also the Gaussiandistributed jitter component. In addition, almost all jitter characteristics are controllable. This jitter generator can be used in jitter tolerance test and jitter transfer function measurement. A Xilinx XC4010 FPGA chip is used to validate this design.","PeriodicalId":358790,"journal":{"name":"Proceedings. Ninth IEEE European Test Symposium, 2004. ETS 2004.","volume":"1 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2004-05-23","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"9","resultStr":"{\"title\":\"Delay chain based programmable jitter generator\",\"authors\":\"T. Xia, P. Song, K. Jenkins, Jien-Chung Lo\",\"doi\":\"10.1109/ETSYM.2004.1347578\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"In this paper, we presents a programmable jitter generator. Different from the traditional jitter generator that uses the analog phase modulation (PM) technique to generate only non-Gaussian distributed jitter components, the proposed jitter generator uses digital techniques. It consists of a voltage controlled delay chain, jitter control block, and some basic digital components. It can generate not only the non-Gaussian distributed jitter component, but also the Gaussiandistributed jitter component. In addition, almost all jitter characteristics are controllable. This jitter generator can be used in jitter tolerance test and jitter transfer function measurement. A Xilinx XC4010 FPGA chip is used to validate this design.\",\"PeriodicalId\":358790,\"journal\":{\"name\":\"Proceedings. Ninth IEEE European Test Symposium, 2004. ETS 2004.\",\"volume\":\"1 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2004-05-23\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"9\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"Proceedings. Ninth IEEE European Test Symposium, 2004. ETS 2004.\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/ETSYM.2004.1347578\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"Proceedings. Ninth IEEE European Test Symposium, 2004. ETS 2004.","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/ETSYM.2004.1347578","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 9

摘要

本文提出了一种可编程抖动发生器。传统的抖动发生器采用模拟调相(PM)技术只产生非高斯分布抖动分量,而本文提出的抖动发生器采用数字技术。它由压控延迟链、抖动控制块和一些基本的数字元件组成。它既能产生非高斯分布抖动分量,又能产生高斯分布抖动分量。此外,几乎所有的抖动特性都是可控的。该抖动发生器可用于抖动公差测试和抖动传递函数测量。采用Xilinx XC4010 FPGA芯片验证了该设计。
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Delay chain based programmable jitter generator
In this paper, we presents a programmable jitter generator. Different from the traditional jitter generator that uses the analog phase modulation (PM) technique to generate only non-Gaussian distributed jitter components, the proposed jitter generator uses digital techniques. It consists of a voltage controlled delay chain, jitter control block, and some basic digital components. It can generate not only the non-Gaussian distributed jitter component, but also the Gaussiandistributed jitter component. In addition, almost all jitter characteristics are controllable. This jitter generator can be used in jitter tolerance test and jitter transfer function measurement. A Xilinx XC4010 FPGA chip is used to validate this design.
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