一个12位,2毫秒/秒,0.016毫米2列并行读出循环ADC,由于前馈尖峰消除器,降低了50%的转换率要求

S. Ganta, A. Tomasini, A. Taparia, Taehee Cho, M. Kulkarni, O. Erdogan
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引用次数: 3

摘要

本出版物提出了一种循环a /D转换器系统,可用于列并行传感器读出应用。转换器系统包括ADC、完全集成的ADC参考、定时发生器、校准引擎和片上斜坡发生器,用于完成片上测试。本出版物解决了电容共享循环和流水线adc中前馈瞬态故障的夸大问题。本文还解决了管道和循环ADC完全集成文献中存在的电压范围减小、记忆效应等问题。核心循环ADC在12位分辨率和2MS/s转换速率下工作的面积仅为0.016mm2。测得的DNL和INL分别为+0.47/-0.68 LSB和+/-0.99 LSB。ADC采用台积电55nm CMOS技术,采用3.3V器件,3.3V电源功耗850μW。
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A 12 bit, 2-MS/s, 0.016-mm2 column-parallel readout cyclic ADC, having 50% reduced slew rate requirement due to feed-forward spike eliminator
This publication presents a cyclic A/D converter system, which can be used for column-parallel sensor readout applications. The converter system includes ADC, fully integrated ADC references, timing generator, calibration engine, and an on-chip ramp generator for complete on-chip testing. This publication solves the exaggerated issue of feed-forward transient glitches in capacitor-shared cyclic and pipelined ADCs. This publication also solves some existing issues in fully integrated references of pipeline and cyclic ADC, namely reduced voltage range, and memory effects. The area of the core cyclic ADC operating at 12 bit resolution and 2MS/s conversion rate is only 0.016mm2. The measured DNL and INL are +0.47/-0.68 LSB and +/-0.99 LSB respectively. The ADC is implemented in TSMC 55nm CMOS technology using 3.3V devices, the ADC consumes 850μW from 3.3V supply.
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