{"title":"大信号网络分析。大信号网络分析仪的测量能力概述","authors":"F. Verbeyst, E. Vandamme","doi":"10.1109/ARFTG.2001.327495","DOIUrl":null,"url":null,"abstract":"This article explains the rationale of performing ¿large-signal network analysis¿ and the basic concepts involved. The focus is on the measurement technology required to perform fully calibrated measurements on nonlinear devices in a versatile environment (different bias, source and load mismatch conditions, continuous wave or modulation). Furthermore this technology is compared to existing approaches. Finally a readily available measurement system is described, which represents the latest developments from Agilent Technologies in the domain of large-signal network analysis.","PeriodicalId":331830,"journal":{"name":"58th ARFTG Conference Digest","volume":null,"pages":null},"PeriodicalIF":0.0000,"publicationDate":"2001-11-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"10","resultStr":"{\"title\":\"Large-Signal Network Analysis. Overview of the measurement capabilities of a Large-Signal Network Analyzer\",\"authors\":\"F. Verbeyst, E. Vandamme\",\"doi\":\"10.1109/ARFTG.2001.327495\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"This article explains the rationale of performing ¿large-signal network analysis¿ and the basic concepts involved. The focus is on the measurement technology required to perform fully calibrated measurements on nonlinear devices in a versatile environment (different bias, source and load mismatch conditions, continuous wave or modulation). Furthermore this technology is compared to existing approaches. Finally a readily available measurement system is described, which represents the latest developments from Agilent Technologies in the domain of large-signal network analysis.\",\"PeriodicalId\":331830,\"journal\":{\"name\":\"58th ARFTG Conference Digest\",\"volume\":null,\"pages\":null},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2001-11-01\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"10\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"58th ARFTG Conference Digest\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/ARFTG.2001.327495\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"58th ARFTG Conference Digest","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/ARFTG.2001.327495","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
Large-Signal Network Analysis. Overview of the measurement capabilities of a Large-Signal Network Analyzer
This article explains the rationale of performing ¿large-signal network analysis¿ and the basic concepts involved. The focus is on the measurement technology required to perform fully calibrated measurements on nonlinear devices in a versatile environment (different bias, source and load mismatch conditions, continuous wave or modulation). Furthermore this technology is compared to existing approaches. Finally a readily available measurement system is described, which represents the latest developments from Agilent Technologies in the domain of large-signal network analysis.
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