SPICE特性测试掩模和测试数据库的自动生成

ICMTS 1999. Proceedings of 1999 International Conference on Microelectronic Test Structures (Cat. No.99CH36307) Pub Date : 1999-03-15 DOI:10.1109/ICMTS.1999.766219

L. Kasel, C. McAndrew, P. Drennan, W.F. Davis, R. Ida

{"title":"SPICE特性测试掩模和测试数据库的自动生成","authors":"L. Kasel, C. McAndrew, P. Drennan, W.F. Davis, R. Ida","doi":"10.1109/ICMTS.1999.766219","DOIUrl":null,"url":null,"abstract":"This paper presents procedures and software tools for automatic generation of test masks, and mask and measurement databases, for SPICE model characterization. The process uses Cadence Pcells, and requires user specification only of a small amount of biasing information. The tools generate device instances, place and route the devices, extract test array coordinates and contents from layout for auto-probing, generate measurement test plans, and generate test mask documentation.","PeriodicalId":273071,"journal":{"name":"ICMTS 1999. Proceedings of 1999 International Conference on Microelectronic Test Structures (Cat. No.99CH36307)","volume":"1 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"1999-03-15","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"9","resultStr":"{\"title\":\"Automated generation of SPICE characterization test masks and test databases\",\"authors\":\"L. Kasel, C. McAndrew, P. Drennan, W.F. Davis, R. Ida\",\"doi\":\"10.1109/ICMTS.1999.766219\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"This paper presents procedures and software tools for automatic generation of test masks, and mask and measurement databases, for SPICE model characterization. The process uses Cadence Pcells, and requires user specification only of a small amount of biasing information. The tools generate device instances, place and route the devices, extract test array coordinates and contents from layout for auto-probing, generate measurement test plans, and generate test mask documentation.\",\"PeriodicalId\":273071,\"journal\":{\"name\":\"ICMTS 1999. Proceedings of 1999 International Conference on Microelectronic Test Structures (Cat. No.99CH36307)\",\"volume\":\"1 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"1999-03-15\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"9\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"ICMTS 1999. Proceedings of 1999 International Conference on Microelectronic Test Structures (Cat. No.99CH36307)\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/ICMTS.1999.766219\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"ICMTS 1999. Proceedings of 1999 International Conference on Microelectronic Test Structures (Cat. No.99CH36307)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/ICMTS.1999.766219","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}

引用次数: 9

摘要

本文介绍了用于SPICE模型表征的自动生成测试掩模的程序和软件工具，以及掩模和测量数据库。该过程使用Cadence Pcells，并且只需要用户说明少量的偏置信息。工具生成设备实例，放置和路由设备，从自动探测的布局中提取测试阵列坐标和内容，生成测量测试计划，并生成测试掩码文档。

本文章由计算机程序翻译，如有差异，请以英文原文为准。

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Automated generation of SPICE characterization test masks and test databases

This paper presents procedures and software tools for automatic generation of test masks, and mask and measurement databases, for SPICE model characterization. The process uses Cadence Pcells, and requires user specification only of a small amount of biasing information. The tools generate device instances, place and route the devices, extract test array coordinates and contents from layout for auto-probing, generate measurement test plans, and generate test mask documentation.

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ICMTS 1999. Proceedings of 1999 International Conference on Microelectronic Test Structures (Cat. No.99CH36307)

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