{"title":"典型毫米波倒装封装中泄漏和串扰的抑制","authors":"G. Lee, Hai-Young Lee","doi":"10.1109/EPEP.1997.634069","DOIUrl":null,"url":null,"abstract":"Leakage phenomena of flip-chip structures on common GaAs and alumina main substrates are characterized using the spectral domain approach to reduce the possible chip-to-chip crosstalk and transmission resonance. We have found that the longitudinal section magnetic mode is dominant for the coplanar waveguide leakage and the leakage can be suppressed by properly managing the gap height and the main substrate thickness in addition to the dielectric constant.","PeriodicalId":220951,"journal":{"name":"Electrical Performance of Electronic Packaging","volume":"33 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"1997-10-27","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"1","resultStr":"{\"title\":\"Suppression of leakage and crosstalk in typical millimeter-wave flip-chip packages\",\"authors\":\"G. Lee, Hai-Young Lee\",\"doi\":\"10.1109/EPEP.1997.634069\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"Leakage phenomena of flip-chip structures on common GaAs and alumina main substrates are characterized using the spectral domain approach to reduce the possible chip-to-chip crosstalk and transmission resonance. We have found that the longitudinal section magnetic mode is dominant for the coplanar waveguide leakage and the leakage can be suppressed by properly managing the gap height and the main substrate thickness in addition to the dielectric constant.\",\"PeriodicalId\":220951,\"journal\":{\"name\":\"Electrical Performance of Electronic Packaging\",\"volume\":\"33 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"1997-10-27\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"1\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"Electrical Performance of Electronic Packaging\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/EPEP.1997.634069\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"Electrical Performance of Electronic Packaging","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/EPEP.1997.634069","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
Suppression of leakage and crosstalk in typical millimeter-wave flip-chip packages
Leakage phenomena of flip-chip structures on common GaAs and alumina main substrates are characterized using the spectral domain approach to reduce the possible chip-to-chip crosstalk and transmission resonance. We have found that the longitudinal section magnetic mode is dominant for the coplanar waveguide leakage and the leakage can be suppressed by properly managing the gap height and the main substrate thickness in addition to the dielectric constant.