模拟电路测试

A. Hatzopoulos
{"title":"模拟电路测试","authors":"A. Hatzopoulos","doi":"10.1109/IMS3TW.2017.7995206","DOIUrl":null,"url":null,"abstract":"Although most of the integrated circuits in everyday applications surrounding us are digital, analog electronic circuits are still necessary, since the real world is “analog” and our human sensors and “transmitters” are also analog (ears, eyes, speech). Testing of these analog, mixedsignal and RF parts poses challenges quite different from those imposed by digital modules, while increasing considerably the cost of testing complex SoC. A set of analog circuit testing methods will be discussed. More specifically, the supply current testing method, the application of Wavelets and other techniques, and the classification-based testing will be described and their benefits versus the traditional specification-based test methods will be underlined.","PeriodicalId":115078,"journal":{"name":"2017 International Mixed Signals Testing Workshop (IMSTW)","volume":"16 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2017-07-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"5","resultStr":"{\"title\":\"Analog circuit testing\",\"authors\":\"A. Hatzopoulos\",\"doi\":\"10.1109/IMS3TW.2017.7995206\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"Although most of the integrated circuits in everyday applications surrounding us are digital, analog electronic circuits are still necessary, since the real world is “analog” and our human sensors and “transmitters” are also analog (ears, eyes, speech). Testing of these analog, mixedsignal and RF parts poses challenges quite different from those imposed by digital modules, while increasing considerably the cost of testing complex SoC. A set of analog circuit testing methods will be discussed. More specifically, the supply current testing method, the application of Wavelets and other techniques, and the classification-based testing will be described and their benefits versus the traditional specification-based test methods will be underlined.\",\"PeriodicalId\":115078,\"journal\":{\"name\":\"2017 International Mixed Signals Testing Workshop (IMSTW)\",\"volume\":\"16 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2017-07-01\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"5\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"2017 International Mixed Signals Testing Workshop (IMSTW)\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/IMS3TW.2017.7995206\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"2017 International Mixed Signals Testing Workshop (IMSTW)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/IMS3TW.2017.7995206","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 5

摘要

虽然我们周围的日常应用中的大多数集成电路是数字的,但模拟电子电路仍然是必要的,因为现实世界是“模拟的”,我们的人类传感器和“发射器”也是模拟的(耳朵、眼睛、语言)。测试这些模拟、混合信号和射频部件所面临的挑战与数字模块所带来的挑战完全不同,同时大大增加了测试复杂SoC的成本。本文将讨论一套模拟电路的测试方法。更具体地说,将描述供电电流测试方法、小波和其他技术的应用以及基于分类的测试,并强调它们与传统的基于规格的测试方法相比的优势。
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Analog circuit testing
Although most of the integrated circuits in everyday applications surrounding us are digital, analog electronic circuits are still necessary, since the real world is “analog” and our human sensors and “transmitters” are also analog (ears, eyes, speech). Testing of these analog, mixedsignal and RF parts poses challenges quite different from those imposed by digital modules, while increasing considerably the cost of testing complex SoC. A set of analog circuit testing methods will be discussed. More specifically, the supply current testing method, the application of Wavelets and other techniques, and the classification-based testing will be described and their benefits versus the traditional specification-based test methods will be underlined.
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Analytical study of on-chip generations of analog sine-wave based on combined digital signals Reliability analysis and mitigation of near threshold caches Verification and test of real circuits Analog circuit testing Design of efficient analog physically unclonable functions using alternative test principles
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