{"title":"α ram:用于氡监测的α粒子探测MOS集成电路","authors":"R. Griffin, H. Le, D.T. Jack, N. G. Tarr","doi":"10.1109/MNRC.2008.4683381","DOIUrl":null,"url":null,"abstract":"A custom integrated circuit (ldquoalphaRAMrdquo) capable of detecting the alpha particles emitted in the decay of radon and its progeny has been designed, fabricated and successfully tested. The alphaRAM has been incorporated in a complete radon monitor using electrostatic concentration of radon progeny. The monitor can detect hazardous levels of radon within hours.","PeriodicalId":247684,"journal":{"name":"2008 1st Microsystems and Nanoelectronics Research Conference","volume":"42 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2008-11-21","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"5","resultStr":"{\"title\":\"αRAM: An α particle detecting MOS IC for radon monitoring\",\"authors\":\"R. Griffin, H. Le, D.T. Jack, N. G. Tarr\",\"doi\":\"10.1109/MNRC.2008.4683381\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"A custom integrated circuit (ldquoalphaRAMrdquo) capable of detecting the alpha particles emitted in the decay of radon and its progeny has been designed, fabricated and successfully tested. The alphaRAM has been incorporated in a complete radon monitor using electrostatic concentration of radon progeny. The monitor can detect hazardous levels of radon within hours.\",\"PeriodicalId\":247684,\"journal\":{\"name\":\"2008 1st Microsystems and Nanoelectronics Research Conference\",\"volume\":\"42 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2008-11-21\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"5\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"2008 1st Microsystems and Nanoelectronics Research Conference\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/MNRC.2008.4683381\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"2008 1st Microsystems and Nanoelectronics Research Conference","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/MNRC.2008.4683381","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
αRAM: An α particle detecting MOS IC for radon monitoring
A custom integrated circuit (ldquoalphaRAMrdquo) capable of detecting the alpha particles emitted in the decay of radon and its progeny has been designed, fabricated and successfully tested. The alphaRAM has been incorporated in a complete radon monitor using electrostatic concentration of radon progeny. The monitor can detect hazardous levels of radon within hours.
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