基于多个fpga的原型和调试与完整的设计流程

M. Azeem, R. Chotin-Avot, U. Farooq, Maminionja Ravoson, H. Mehrez
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引用次数: 2

摘要

基于多fpga的原型设计以其低成本和高执行速度在设计和验证过程中发挥着重要作用。然而,需要优化这种基于多个fpga的原型的配置流程。在本文中,我们讨论了大型设计的划分,并提出了一种调试方法,该方法使用Altera的Quartus工具使用Signal Tap II嵌入式逻辑分析仪对这些划分的设计进行调试。通常使用SignalTap II工具调试在单个FPGA上实现的设计,该逻辑分析仪在不使用外部调试设备的情况下,通过探测内部信号的状态来调试FPGA器件。然而,我们在多个fpga上使用SignalTap II逻辑分析仪进行大型设计,并且我们促进了数千个正在考虑的信号的调试方法。我们建议在划分后通过开发技术来跟踪需要测试的信号通过多个FPGA而不使用FPGA内部存储器的大型设计的调试。我们还生成了各种大型基准测试,并针对多个基于fpga的原型进行了测试。
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Multiple FPGAs based prototyping and debugging with complete design flow
Multiple FPGA-based prototyping plays an important role in the design and verification process due to their low cost and high execution speed. However, there is a need to optimize the configuration flow of this multiple FPGA-based prototyping. In this paper, we address the partitioning of large designs and propose a debugging methodology for these partitioned designs using Signal Tap II embedded logic analyzer by Quartus tool of Altera. Usually SignalTap II tool is used to debug design implemented on single FPGA and this logic analyzer debugs FPGA device by probing the states of internal signals without using external debug equipment. However, we use SignalTap II logic analyzer for large designs on multiple FPGAs and we facilitate the debugging methodology for thousands of signals under consideration. We propose the debugging of large designs after partitioning by developing the techniques to trace the required signals under test through multiple FPGAs without using FPGA internal memory. We have generated various large benchmarks as well and tested them for multiple FPGA-based prototyping.
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