I. Troxel, Justin J. Schaefer, Matthew Gruber, Daniel Sabogal, David Ellis, J. Schaf, Gates West
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Heavy Ion and Proton Test Results for Recent-Generation GPUs
Destructive SEE, proton-induced TID, and heavy ion and proton non-destructive SEE sensitivity characterization results are presented for recent-generation AMD and NVIDIA GPU SOCs.
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