{"title":"采用90纳米CMOS技术的6-b 1-GS/s 30mw ADC","authors":"Yuanching Lien, Jri Lee","doi":"10.1109/ASSCC.2008.4708725","DOIUrl":null,"url":null,"abstract":"A 6-b 1-GS/s subranging ADC with THA is implemented in 90-nm CMOS technology. This circuit incorporates folded input for the fine ADC as well as offset calibration and digital correction techniques, achieving greater than 5.2 ENOB and 40-dB SFDR up to the Nyquist, and 1.1-GHz ERBW with power consumption of only 30 mW.","PeriodicalId":143173,"journal":{"name":"2008 IEEE Asian Solid-State Circuits Conference","volume":"26 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2008-12-12","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"8","resultStr":"{\"title\":\"A 6-b 1-GS/s 30-mW ADC in 90-nm CMOS technology\",\"authors\":\"Yuanching Lien, Jri Lee\",\"doi\":\"10.1109/ASSCC.2008.4708725\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"A 6-b 1-GS/s subranging ADC with THA is implemented in 90-nm CMOS technology. This circuit incorporates folded input for the fine ADC as well as offset calibration and digital correction techniques, achieving greater than 5.2 ENOB and 40-dB SFDR up to the Nyquist, and 1.1-GHz ERBW with power consumption of only 30 mW.\",\"PeriodicalId\":143173,\"journal\":{\"name\":\"2008 IEEE Asian Solid-State Circuits Conference\",\"volume\":\"26 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2008-12-12\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"8\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"2008 IEEE Asian Solid-State Circuits Conference\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/ASSCC.2008.4708725\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"2008 IEEE Asian Solid-State Circuits Conference","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/ASSCC.2008.4708725","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 8
摘要
采用90纳米CMOS技术实现了一个带THA的6-b 1-GS/s分位ADC。该电路集成了用于精细ADC的折叠输入以及失调校准和数字校正技术,实现了高达奈奎斯特的大于5.2 ENOB和40 db SFDR,以及1.1 ghz ERBW,功耗仅为30 mW。
A 6-b 1-GS/s subranging ADC with THA is implemented in 90-nm CMOS technology. This circuit incorporates folded input for the fine ADC as well as offset calibration and digital correction techniques, achieving greater than 5.2 ENOB and 40-dB SFDR up to the Nyquist, and 1.1-GHz ERBW with power consumption of only 30 mW.