特邀演讲:MEMS:推动电子器件的进步

S. Groothuis
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引用次数: 0

摘要

本课程的目标是通过涵盖封装,可靠性,仿真和测试,为您提供MEMS技术的简要概述。我们将探讨传感器融合、集成CMOS-MEMS和生物机械系统等最新发展。您将通过课程的重点关注两个关键主题,深入了解与将基于MEMS的产品推向市场相关的挑战和机遇:(1)MEMS封装-您将学习MEMS器件的封装概念,同时审查组装和封装程序,如结构释放,清洁,封装和测试。本教程还将介绍与封装和测试MEMS相关的各种挑战。(2) MEMS可靠性-本教程将回顾MEMS可靠性问题和相关的分析/仿真技术。为了应对研究、开发和产品化过程中的挑战,MEMS可靠性需要对物理、材料科学和力学有广泛的了解。
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Invited tutorial: MEMS: Driving advances in electronic devices
The goal of the course is to give you a brief overview of MEMS technologies by covering packaging, reliability, simulation, and testing. We will venture into recent developments like Sensor Fusion, Integrated CMOS-MEMS, and BioMEMS. You will gain an in-depth knowledge of challenges and opportunities associated with bringing MEMS-based products to market through the course's focus on two key topics: (1) MEMS Packaging - You will learn packaging concepts for MEMS devices while reviewing assembly and packaging procedures such as structural release, cleaning, encapsulation, and testing. The tutorial will also cover various challenges associated with packaging and testing MEMS. (2) MEMS Reliability - This tutorial will review MEMS reliability issues and associated analysis/simulation techniques. MEMS reliability requires a broad understanding of physics, material science, and mechanics in order to handle the challenges during research, development, and productization.
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Comparison of passive enforcement techniques for DRAM package models Welcome to the 2013 IEEE WMED A new method for causality enforcement of DRAM package models using discrete hilbert transforms Invited talk: Computing beyond the 11nm node: Which devices will we use? Invited tutorial: Channel equalization: Techniques for high-speed electrical links
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