芯片间互连的高密度硅载波传输线设计

X. Gu, L. Turlapati, B. Dang, C. Tsang, P. Andry, T. Dickson, Michael P. Beakes, J. Knickerbocker, D. Friedman
{"title":"芯片间互连的高密度硅载波传输线设计","authors":"X. Gu, L. Turlapati, B. Dang, C. Tsang, P. Andry, T. Dickson, Michael P. Beakes, J. Knickerbocker, D. Friedman","doi":"10.1109/EPEPS.2011.6100177","DOIUrl":null,"url":null,"abstract":"Two differential stripline configurations with pitches of 8µm and 22µm are designed for ultra dense interconnect on silicon carrier. The transmission lines are implemented using four wiring levels to support chip-to-chip communication at 11.5Gb/s data rate over 2cm without equalization. Loss characteristics are extracted from test coupons with good model-to-hardware correlation. Impedance and temperature dependent loss performance are analyzed with simulation. Crosstalk performance between two pairs with and without ground shielding, as well as between two twisted pairs, are also evaluated with hardware measurement.","PeriodicalId":313560,"journal":{"name":"2011 IEEE 20th Conference on Electrical Performance of Electronic Packaging and Systems","volume":"8 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2011-12-12","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"16","resultStr":"{\"title\":\"High-density silicon carrier transmission line design for chip-to-chip interconnects\",\"authors\":\"X. Gu, L. Turlapati, B. Dang, C. Tsang, P. Andry, T. Dickson, Michael P. Beakes, J. Knickerbocker, D. Friedman\",\"doi\":\"10.1109/EPEPS.2011.6100177\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"Two differential stripline configurations with pitches of 8µm and 22µm are designed for ultra dense interconnect on silicon carrier. The transmission lines are implemented using four wiring levels to support chip-to-chip communication at 11.5Gb/s data rate over 2cm without equalization. Loss characteristics are extracted from test coupons with good model-to-hardware correlation. Impedance and temperature dependent loss performance are analyzed with simulation. Crosstalk performance between two pairs with and without ground shielding, as well as between two twisted pairs, are also evaluated with hardware measurement.\",\"PeriodicalId\":313560,\"journal\":{\"name\":\"2011 IEEE 20th Conference on Electrical Performance of Electronic Packaging and Systems\",\"volume\":\"8 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2011-12-12\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"16\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"2011 IEEE 20th Conference on Electrical Performance of Electronic Packaging and Systems\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/EPEPS.2011.6100177\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"2011 IEEE 20th Conference on Electrical Performance of Electronic Packaging and Systems","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/EPEPS.2011.6100177","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 16

摘要

两种差分带状线配置,间距为8µm和22µm,设计用于硅载体上的超密集互连。传输线采用四个布线级别实现,以支持超过2cm的11.5Gb/s数据速率的芯片对芯片通信,无需均衡。从具有良好的模型-硬件相关性的测试卷中提取损耗特征。通过仿真分析了阻抗和温度相关的损耗性能。用硬件测量方法对带地屏蔽和不带地屏蔽的双绞线之间以及双绞线之间的串扰性能进行了评价。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
查看原文
分享 分享
微信好友 朋友圈 QQ好友 复制链接
本刊更多论文
High-density silicon carrier transmission line design for chip-to-chip interconnects
Two differential stripline configurations with pitches of 8µm and 22µm are designed for ultra dense interconnect on silicon carrier. The transmission lines are implemented using four wiring levels to support chip-to-chip communication at 11.5Gb/s data rate over 2cm without equalization. Loss characteristics are extracted from test coupons with good model-to-hardware correlation. Impedance and temperature dependent loss performance are analyzed with simulation. Crosstalk performance between two pairs with and without ground shielding, as well as between two twisted pairs, are also evaluated with hardware measurement.
求助全文
通过发布文献求助,成功后即可免费获取论文全文。 去求助
来源期刊
自引率
0.00%
发文量
0
期刊最新文献
Simulations of pulse signals with X-parameters Extraction of jitter parameters from BER measurements Full-wave PEEC time domain solver based on leapfrog scheme Bended differential transmission line using short-circuited coupled line for common-mode noise suppression Deriving voltage tolerance specification for processor circuit design
×
引用
GB/T 7714-2015
复制
MLA
复制
APA
复制
导出至
BibTeX EndNote RefMan NoteFirst NoteExpress
×
×
提示
您的信息不完整,为了账户安全,请先补充。
现在去补充
×
提示
您因"违规操作"
具体请查看互助需知
我知道了
×
提示
现在去查看 取消
×
提示
确定
0
微信
客服QQ
Book学术公众号 扫码关注我们
反馈
×
意见反馈
请填写您的意见或建议
请填写您的手机或邮箱
已复制链接
已复制链接
快去分享给好友吧!
我知道了
×
扫码分享
扫码分享
Book学术官方微信
Book学术文献互助
Book学术文献互助群
群 号:481959085
Book学术
文献互助 智能选刊 最新文献 互助须知 联系我们:info@booksci.cn
Book学术提供免费学术资源搜索服务,方便国内外学者检索中英文文献。致力于提供最便捷和优质的服务体验。
Copyright © 2023 Book学术 All rights reserved.
ghs 京公网安备 11010802042870号 京ICP备2023020795号-1