纳米颗粒增强无铅BGA焊点的缺点

Huayu Sun, Y. Chan
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引用次数: 0

摘要

本研究采用机械搅拌法制备掺杂了0.5 wt.%碳纳米管的锡膏,检测了纳米颗粒在锡球中的再分布现象。部分纳米粒子随助焊剂向外流动而严重分离,使相关定量实验失去准确性。一些纳米粒子严重聚集在焊锡球中,对焊点产生不利影响,使补强层的降解现象变得严重。为了研究纳米颗粒增强焊点的退化现象,比较了Sn58Bi、Sn57.6Bi0.4Ag和掺杂Sn58Bi+0.4Ag在时效过程中的力学性能。球剪试验结果表明,掺入Sn58Bi+0.4Ag的焊点出现了严重的补强退化现象。与Sn58Bi和sn576 bi0.4 ag焊点相比,由于Ag3Sn IMCs的聚集,掺杂Sn58Bi+0.4Ag焊点在时效100h后失去了力学优势。
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Drawbacks of the nanoparticle reinforced lead-free BGA solder joints
In this study, 0.5 wt.% CNTs-doped solder paste, that prepared by mechanical stirring, was used to detect the redistribution phenomenon of nanoparticles in the solder ball. Some of nanoparticles seriously separated out with the outward flow of solder flux, making related quantitative experiments loss their accuracy. Some of nanoparticles seriously gathered in the solder ball, having negative effects on the solder joint and making the phenomenon of degradation of reinforcement become serious. To study the degradation phenomenon of nanoparticle reinforced solder joint, mechanical properties of Sn58Bi, Sn57.6Bi0.4Ag and doped Sn58Bi+0.4Ag were compared during aging. According to the result of ball shear test, the degradation of reinforcement was seriously happened in the doped Sn58Bi+0.4Ag solder joints. Caused by the gathered Ag3Sn IMCs, the doped Sn58Bi+0.4Ag solder joints lost its mechanical advantages after 100h aging, comparing with Sn58Bi and Sn57.6Bi0.4Ag solder joints.
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