{"title":"现代微控制器设计和芯片诊断中的节能模式","authors":"S. Jankovic, D. Maksimovic","doi":"10.1109/MIEL.2002.1003327","DOIUrl":null,"url":null,"abstract":"This paper is targeting some of the most important problems in modern microcontroller-on-chip design: low power consumption and efficient chip diagnostics. A case study of a microcontroller device is presented. Applied system-level techniques for dynamic power saving are described. Chip diagnostic methods are developed that are based on measuring of the supply current in different power saving modes.","PeriodicalId":221518,"journal":{"name":"2002 23rd International Conference on Microelectronics. Proceedings (Cat. No.02TH8595)","volume":null,"pages":null},"PeriodicalIF":0.0000,"publicationDate":"2002-08-07","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"7","resultStr":"{\"title\":\"Power saving modes in modern microcontroller design and chip diagnostics\",\"authors\":\"S. Jankovic, D. Maksimovic\",\"doi\":\"10.1109/MIEL.2002.1003327\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"This paper is targeting some of the most important problems in modern microcontroller-on-chip design: low power consumption and efficient chip diagnostics. A case study of a microcontroller device is presented. Applied system-level techniques for dynamic power saving are described. Chip diagnostic methods are developed that are based on measuring of the supply current in different power saving modes.\",\"PeriodicalId\":221518,\"journal\":{\"name\":\"2002 23rd International Conference on Microelectronics. Proceedings (Cat. No.02TH8595)\",\"volume\":null,\"pages\":null},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2002-08-07\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"7\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"2002 23rd International Conference on Microelectronics. Proceedings (Cat. No.02TH8595)\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/MIEL.2002.1003327\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"2002 23rd International Conference on Microelectronics. Proceedings (Cat. No.02TH8595)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/MIEL.2002.1003327","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
Power saving modes in modern microcontroller design and chip diagnostics
This paper is targeting some of the most important problems in modern microcontroller-on-chip design: low power consumption and efficient chip diagnostics. A case study of a microcontroller device is presented. Applied system-level techniques for dynamic power saving are described. Chip diagnostic methods are developed that are based on measuring of the supply current in different power saving modes.