从测量或计算的微带元件和不连续点的s参数中提取spice型等效电路的新技术

Electrical Performance of Electronic Packaging Pub Date : 1997-10-27 DOI:10.1109/EPEP.1997.634041

P. Werner, Raj Mittra

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引用次数: 2

摘要

本文介绍了一种基于遗传算法(GA)的新技术，用于提取可插入SPICE仿真的测量或计算s参数的等效电路。遗传算法是一种强大的优化工具，在微带线直角弯曲的样本测试案例中显示出良好的结果。

本文章由计算机程序翻译，如有差异，请以英文原文为准。

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A new technique for the extraction of SPICE-type equivalent circuits from measured or computed S-parameters of microstrip components and discontinuities

This paper introduces a new technique based on the application of the Genetic Algorithm (GA) for extracting the equivalent circuits for measured or computed S-parameters that can be inserted into SPICE simulations. The GA is a robust optimization tool that is shown to yield excellent result for the sample test case of a right angle bend in a microstrip line.

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Electrical Performance of Electronic Packaging

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