O. Mrooz, I. Hadzarnan, M. Vakiv, O. Shpotyuk, J. Plewa, H. Altenburg, H. Uphoff
{"title":"铜镍钴锰矿NTC热敏电阻的老化[Cu/sub 0.1/Ni/sub 0.8/Co/sub 0.2/Mn/sub 1.9/O/sub 4/]","authors":"O. Mrooz, I. Hadzarnan, M. Vakiv, O. Shpotyuk, J. Plewa, H. Altenburg, H. Uphoff","doi":"10.1109/MIEL.2002.1003215","DOIUrl":null,"url":null,"abstract":"Aging phenomenon in copper-nickel-cobalt manganite NTC thermistors under thermal stresses at 125 and 170/spl deg/C during 1000 h was studied. The relative resistance drift observed in NTC thermistors is correlated with the results of Cu/sub 0.1/Ni/sub 0.8/Co/sub 0.2/Mn/sub 1.9/O/sub 4/ ceramic microstructures characterization (obtained by optical microscopy, SEM, electron probe and EDX microanalyses) and thermogravimetric analysis.","PeriodicalId":221518,"journal":{"name":"2002 23rd International Conference on Microelectronics. Proceedings (Cat. No.02TH8595)","volume":null,"pages":null},"PeriodicalIF":0.0000,"publicationDate":"2002-08-07","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"7","resultStr":"{\"title\":\"Aging of copper-nickel-cobalt manganite NTC thermistors [Cu/sub 0.1/Ni/sub 0.8/Co/sub 0.2/Mn/sub 1.9/O/sub 4/]\",\"authors\":\"O. Mrooz, I. Hadzarnan, M. Vakiv, O. Shpotyuk, J. Plewa, H. Altenburg, H. Uphoff\",\"doi\":\"10.1109/MIEL.2002.1003215\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"Aging phenomenon in copper-nickel-cobalt manganite NTC thermistors under thermal stresses at 125 and 170/spl deg/C during 1000 h was studied. The relative resistance drift observed in NTC thermistors is correlated with the results of Cu/sub 0.1/Ni/sub 0.8/Co/sub 0.2/Mn/sub 1.9/O/sub 4/ ceramic microstructures characterization (obtained by optical microscopy, SEM, electron probe and EDX microanalyses) and thermogravimetric analysis.\",\"PeriodicalId\":221518,\"journal\":{\"name\":\"2002 23rd International Conference on Microelectronics. Proceedings (Cat. No.02TH8595)\",\"volume\":null,\"pages\":null},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2002-08-07\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"7\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"2002 23rd International Conference on Microelectronics. Proceedings (Cat. No.02TH8595)\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/MIEL.2002.1003215\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"2002 23rd International Conference on Microelectronics. Proceedings (Cat. No.02TH8595)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/MIEL.2002.1003215","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
Aging phenomenon in copper-nickel-cobalt manganite NTC thermistors under thermal stresses at 125 and 170/spl deg/C during 1000 h was studied. The relative resistance drift observed in NTC thermistors is correlated with the results of Cu/sub 0.1/Ni/sub 0.8/Co/sub 0.2/Mn/sub 1.9/O/sub 4/ ceramic microstructures characterization (obtained by optical microscopy, SEM, electron probe and EDX microanalyses) and thermogravimetric analysis.
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