纳米复合材料的低温低压键合

Ting-Jui Wu, Jen-Hsiang Liu, Jenn-Ming Song
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摘要

研究表明,Cu-Ag合金具有比Cu合金更长的电迁移寿命和比Ag合金更好的电化学迁移性能。本课题组研制了一种新型Cu-Ag复合浆料,该浆料能在低加工温度和低粘接压力下实现粘接。它由羧酸包覆的银纳米粒子、疏蒸热解的银亚微米粒子和甲酸铜组成,也可用于互连和键合。在160℃、1.6 MPa、30 min的条件下,Cu表面处理接头的抗剪强度为15.9MPa, Ag表面处理接头的抗剪强度为19.4 MPa。由此得到的烧结结构的电阻率为50.8 μΩ-cm。
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Low-temperature low-pressure bonding by nanocomposites
It has been proposed that Cu-Ag alloys exhibit longer eletromigration life time than Cu as well as superior electrochemical migration resistance than Ag. Our group developed a new kind of Cu-Ag composite paste which is capable of achieving bonding at low processing temperatures under low bonding pressure. It comprises carboxylate-coated Ag nanoparticles, spary-pyrolyz ed Ag submicron particles and copper formate, which can be applied to interconnection and bonding as well. After being bonded at 160°C under loading of 1.6 MPa for 30 min, the joints with Cu substrates possess bonding strength of 15.9MPa and those with Ag surface finish showing shear strength of 19.4 MPa. The electrical resistivity of the sintered structure thus obtained is 50.8 μΩ-cm.
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