低温红外图像传感器读出集成电路中的单事件瞬态中断和功能中断

2017 IEEE Radiation Effects Data Workshop (REDW) Pub Date : 2017-07-01 DOI:10.1109/NSREC.2017.8115480

L. Artola, A. A. Youssef, S. Ducret, R. Buiron, S. Parola, G. Hubert, C. Poivey

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引用次数: 4

摘要

本文介绍了两种读出集成电路在低温重离子束流下的单事件瞬态和功能中断的测量。SEFI发生的温度依赖性是有限的。

本文章由计算机程序翻译，如有差异，请以英文原文为准。

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Single event transient and functional interrupt in readout integrated circuit of infrared image sensors at low temperatures

This work presents the measurements of single event transients and functional interrupts on two designs of readout integrated circuit under a heavy ions beam at cryogenic temperatures. The temperature dependence of the SEFI occurrence is limited.

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2017 IEEE Radiation Effects Data Workshop (REDW)

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