基于表面电位的部分耗尽SOI mosfet紧凑模型

Weimin Wu, Xin Li, G. Gildenblat, G. Workman, S. Veeraraghavan, C. McAndrew, R. V. Langevelde, G. Smit, A. Scholten, D. Klaassen, J. Watts
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引用次数: 23

摘要

本文报道了利用基于表面电位的方法进行部分枯竭(PD) SOI建模的最新进展。新模型称为PSP- soi,是在最新的行业标准批量MOSFET模型PSP的框架内制定的。除了基于物理的配方和继承自PSP的可扩展性外,PSP-SOI还通过包括浮动体模拟功能、寄生双极模型和自加热功能来捕获SOI特定效果。非线性体电阻包括建模体接触SOI器件。PSP-SOI模型已经在几种PD/SOI技术上进行了广泛的测试。
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PSP-SOI: A Surface Potential Based Compact Model of Partially Depleted SOI MOSFETs
This paper reports recent progress on partially depleted (PD) SOI modeling using a surface potential based approach. The new model, called PSP-SOI, is formulated within the framework of the latest industry standard bulk MOSFET model PSP. In addition to its physics-based formulation and scalability inherited from PSP, PSP-SOI captures SOI specific effects by including a floating body simulation capability, a parasitic bipolar model, and self-heating. A nonlinear body resistance is included for modeling body-contacted SOI devices. The PSP-SOI model has been extensively tested on several PD/SOI technologies.
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