XQE-0920商用现货CMOS光子成像仪微电路的重离子诱导单事件效应表征

2021 IEEE Nuclear and Space Radiation Effects Conference (NSREC) Pub Date : 2021-07-01 DOI:10.1109/NSREC45046.2021.9679348

R. Koga, S. Davis, A. Berman, D. Mabry

{"title":"XQE-0920商用现货CMOS光子成像仪微电路的重离子诱导单事件效应表征","authors":"R. Koga, S. Davis, A. Berman, D. Mabry","doi":"10.1109/NSREC45046.2021.9679348","DOIUrl":null,"url":null,"abstract":"We present observations of heavy ion induced single event effects on the XQE-0920 CMOS imager microcircuit. Pixel upsets as well as upsets accompanying a high level of bias current were observed.","PeriodicalId":340911,"journal":{"name":"2021 IEEE Nuclear and Space Radiation Effects Conference (NSREC)","volume":"19 3 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2021-07-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":"{\"title\":\"Heavy Ion Induced Single Event Effects Characterization of the XQE-0920 Commercial Off-the-shelf CMOS Photonic Imager Microcircuit\",\"authors\":\"R. Koga, S. Davis, A. Berman, D. Mabry\",\"doi\":\"10.1109/NSREC45046.2021.9679348\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"We present observations of heavy ion induced single event effects on the XQE-0920 CMOS imager microcircuit. Pixel upsets as well as upsets accompanying a high level of bias current were observed.\",\"PeriodicalId\":340911,\"journal\":{\"name\":\"2021 IEEE Nuclear and Space Radiation Effects Conference (NSREC)\",\"volume\":\"19 3 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2021-07-01\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"0\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"2021 IEEE Nuclear and Space Radiation Effects Conference (NSREC)\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/NSREC45046.2021.9679348\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"2021 IEEE Nuclear and Space Radiation Effects Conference (NSREC)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/NSREC45046.2021.9679348","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}

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摘要

我们在XQE-0920 CMOS成像仪微电路上观察到重离子诱导的单事件效应。观察到像素扰动以及伴随高偏置电流的扰动。

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Heavy Ion Induced Single Event Effects Characterization of the XQE-0920 Commercial Off-the-shelf CMOS Photonic Imager Microcircuit

We present observations of heavy ion induced single event effects on the XQE-0920 CMOS imager microcircuit. Pixel upsets as well as upsets accompanying a high level of bias current were observed.

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2021 IEEE Nuclear and Space Radiation Effects Conference (NSREC)

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