{"title":"伪堵漏故障模型的比较研究","authors":"S. Zachariah, S. Chakravarty","doi":"10.1109/ICVD.1999.745130","DOIUrl":null,"url":null,"abstract":"Pseudo stuck-at is a popular model, used by many commercial tool vendors, for evaluating and selecting I/sub DDQ/ tests. We show that pseudo stuck-at fault coverage numbers are very pessimistic, and equally good vectors can be selected much faster using the leakage fault model. This, and the fact that a fast simulation algorithm exists for leakage faults, prompts us to propose the use of the leakage fault model.","PeriodicalId":443373,"journal":{"name":"Proceedings Twelfth International Conference on VLSI Design. (Cat. No.PR00013)","volume":"42 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"1999-01-10","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"4","resultStr":"{\"title\":\"A comparative study of pseudo stuck-at and leakage fault model\",\"authors\":\"S. Zachariah, S. Chakravarty\",\"doi\":\"10.1109/ICVD.1999.745130\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"Pseudo stuck-at is a popular model, used by many commercial tool vendors, for evaluating and selecting I/sub DDQ/ tests. We show that pseudo stuck-at fault coverage numbers are very pessimistic, and equally good vectors can be selected much faster using the leakage fault model. This, and the fact that a fast simulation algorithm exists for leakage faults, prompts us to propose the use of the leakage fault model.\",\"PeriodicalId\":443373,\"journal\":{\"name\":\"Proceedings Twelfth International Conference on VLSI Design. (Cat. No.PR00013)\",\"volume\":\"42 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"1999-01-10\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"4\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"Proceedings Twelfth International Conference on VLSI Design. (Cat. No.PR00013)\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/ICVD.1999.745130\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"Proceedings Twelfth International Conference on VLSI Design. (Cat. No.PR00013)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/ICVD.1999.745130","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
A comparative study of pseudo stuck-at and leakage fault model
Pseudo stuck-at is a popular model, used by many commercial tool vendors, for evaluating and selecting I/sub DDQ/ tests. We show that pseudo stuck-at fault coverage numbers are very pessimistic, and equally good vectors can be selected much faster using the leakage fault model. This, and the fact that a fast simulation algorithm exists for leakage faults, prompts us to propose the use of the leakage fault model.
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