{"title":"雪崩倍增在一个紧凑的双极晶体管模型电路仿真","authors":"W. Kloosterman, H. de Graaff","doi":"10.1109/BIPOL.1988.51056","DOIUrl":null,"url":null,"abstract":"Weak avalanche in bipolar transistors can be accurately modeled by using the collector depletion capacitance. This model has the advantages of a relatively fast numerical evaluation and an easily extracted avalanche parameter. The model incorporates internal voltage drop and temperature dependence and can be implemented in any compact bipolar transistor model.<<ETX>>","PeriodicalId":302949,"journal":{"name":"Proceedings of the 1988 Bipolar Circuits and Technology Meeting,","volume":"22 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"1988-09-12","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"49","resultStr":"{\"title\":\"Avalanche multiplication in a compact bipolar transistor model for circuit simulation\",\"authors\":\"W. Kloosterman, H. de Graaff\",\"doi\":\"10.1109/BIPOL.1988.51056\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"Weak avalanche in bipolar transistors can be accurately modeled by using the collector depletion capacitance. This model has the advantages of a relatively fast numerical evaluation and an easily extracted avalanche parameter. The model incorporates internal voltage drop and temperature dependence and can be implemented in any compact bipolar transistor model.<<ETX>>\",\"PeriodicalId\":302949,\"journal\":{\"name\":\"Proceedings of the 1988 Bipolar Circuits and Technology Meeting,\",\"volume\":\"22 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"1988-09-12\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"49\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"Proceedings of the 1988 Bipolar Circuits and Technology Meeting,\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/BIPOL.1988.51056\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"Proceedings of the 1988 Bipolar Circuits and Technology Meeting,","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/BIPOL.1988.51056","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
Avalanche multiplication in a compact bipolar transistor model for circuit simulation
Weak avalanche in bipolar transistors can be accurately modeled by using the collector depletion capacitance. This model has the advantages of a relatively fast numerical evaluation and an easily extracted avalanche parameter. The model incorporates internal voltage drop and temperature dependence and can be implemented in any compact bipolar transistor model.<>