{"title":"高注入量对硅态密度的影响","authors":"J. Lowney","doi":"10.1109/BIPOL.1988.51075","DOIUrl":null,"url":null,"abstract":"The effects of high-injection levels on the conduction and valence bands of silicon have been determined according to theory based on first principles. The results show important narrowing of the energy gap by the injected electron-hole plasma as well as a reduction in the dopant-carrier interaction because of a reduction in the free-carrier screening radius. Interestingly, these two effects tend to compensate each other somewhat in heavily doped and heavily injected material. Since the gain of a bipolar device is very sensitive to the bandgap, device models need to include these effects in order to model a device correctly throughout its operating regime.<<ETX>>","PeriodicalId":302949,"journal":{"name":"Proceedings of the 1988 Bipolar Circuits and Technology Meeting,","volume":"26 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"1988-09-12","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"8","resultStr":"{\"title\":\"The effect of high injection on the density of states of silicon\",\"authors\":\"J. Lowney\",\"doi\":\"10.1109/BIPOL.1988.51075\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"The effects of high-injection levels on the conduction and valence bands of silicon have been determined according to theory based on first principles. The results show important narrowing of the energy gap by the injected electron-hole plasma as well as a reduction in the dopant-carrier interaction because of a reduction in the free-carrier screening radius. Interestingly, these two effects tend to compensate each other somewhat in heavily doped and heavily injected material. Since the gain of a bipolar device is very sensitive to the bandgap, device models need to include these effects in order to model a device correctly throughout its operating regime.<<ETX>>\",\"PeriodicalId\":302949,\"journal\":{\"name\":\"Proceedings of the 1988 Bipolar Circuits and Technology Meeting,\",\"volume\":\"26 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"1988-09-12\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"8\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"Proceedings of the 1988 Bipolar Circuits and Technology Meeting,\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/BIPOL.1988.51075\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"Proceedings of the 1988 Bipolar Circuits and Technology Meeting,","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/BIPOL.1988.51075","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
The effect of high injection on the density of states of silicon
The effects of high-injection levels on the conduction and valence bands of silicon have been determined according to theory based on first principles. The results show important narrowing of the energy gap by the injected electron-hole plasma as well as a reduction in the dopant-carrier interaction because of a reduction in the free-carrier screening radius. Interestingly, these two effects tend to compensate each other somewhat in heavily doped and heavily injected material. Since the gain of a bipolar device is very sensitive to the bandgap, device models need to include these effects in order to model a device correctly throughout its operating regime.<>