高注入量对硅态密度的影响

J. Lowney
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引用次数: 8

摘要

根据第一性原理的理论,确定了高注入水平对硅的导价带和价带的影响。结果表明,注入的电子-空穴等离子体显著缩小了能隙,同时由于自由载流子筛选半径的减小,掺杂-载流子相互作用减小。有趣的是,在高掺杂和高注入的材料中,这两种效应倾向于相互补偿。由于双极器件的增益对带隙非常敏感,因此器件模型需要包括这些影响,以便在整个工作状态下正确地建模器件。
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The effect of high injection on the density of states of silicon
The effects of high-injection levels on the conduction and valence bands of silicon have been determined according to theory based on first principles. The results show important narrowing of the energy gap by the injected electron-hole plasma as well as a reduction in the dopant-carrier interaction because of a reduction in the free-carrier screening radius. Interestingly, these two effects tend to compensate each other somewhat in heavily doped and heavily injected material. Since the gain of a bipolar device is very sensitive to the bandgap, device models need to include these effects in order to model a device correctly throughout its operating regime.<>
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