{"title":"除了“已知的好死”，还有其他选择吗?/spl lsqb/ mcm /spl rsqb/","authors":"A. Gattiker, Wojciech Maly, M. E. Thomas","doi":"10.1109/MCMC.1994.292519","DOIUrl":null,"url":null,"abstract":"This paper presents a cost-based methodology for assessing the effectiveness of various MCM implementation strategies. It is focused on testing. Two approaches to the MCM testing problem are investigated in detail. One is based on the assumption that system components are perfect(\"known good die\" approach) and the other uses the \"smart substrate\" concept. An MCM using a smart substrate is one in which the substrate contains active circuitry for carrying out testing functions. For these two testing options, the obtained results suggest the existence of \"windows of opportunity\" for both KGD and smart substrate solutions.<<ETX>>","PeriodicalId":292463,"journal":{"name":"Proceedings of IEEE Multi-Chip Module Conference (MCMC-94)","volume":"18 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"1994-03-15","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"21","resultStr":"{\"title\":\"Are there any alternatives to \\\"known good die\\\" ? /spl lsqb/MCMs/spl rsqb/\",\"authors\":\"A. Gattiker, Wojciech Maly, M. E. Thomas\",\"doi\":\"10.1109/MCMC.1994.292519\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"This paper presents a cost-based methodology for assessing the effectiveness of various MCM implementation strategies. It is focused on testing. Two approaches to the MCM testing problem are investigated in detail. One is based on the assumption that system components are perfect(\\\"known good die\\\" approach) and the other uses the \\\"smart substrate\\\" concept. An MCM using a smart substrate is one in which the substrate contains active circuitry for carrying out testing functions. For these two testing options, the obtained results suggest the existence of \\\"windows of opportunity\\\" for both KGD and smart substrate solutions.<<ETX>>\",\"PeriodicalId\":292463,\"journal\":{\"name\":\"Proceedings of IEEE Multi-Chip Module Conference (MCMC-94)\",\"volume\":\"18 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"1994-03-15\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"21\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"Proceedings of IEEE Multi-Chip Module Conference (MCMC-94)\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/MCMC.1994.292519\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"Proceedings of IEEE Multi-Chip Module Conference (MCMC-94)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/MCMC.1994.292519","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
Are there any alternatives to "known good die" ? /spl lsqb/MCMs/spl rsqb/
This paper presents a cost-based methodology for assessing the effectiveness of various MCM implementation strategies. It is focused on testing. Two approaches to the MCM testing problem are investigated in detail. One is based on the assumption that system components are perfect("known good die" approach) and the other uses the "smart substrate" concept. An MCM using a smart substrate is one in which the substrate contains active circuitry for carrying out testing functions. For these two testing options, the obtained results suggest the existence of "windows of opportunity" for both KGD and smart substrate solutions.<>
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