栅极板布局对SiC-MOSFET热阻抗的影响

F. Kato, S. Sato, H. Hozoji, M. Ikegawa, A. Sakai, K. Watanabe, S. Harada, H. Sato
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引用次数: 0

摘要

本文对由碳化硅肖特基势垒二极管(SiC-SBD)和金属氧化物半导体场效应晶体管(SiC-MOSFET)组成的功率模块的热阻抗Zth进行了测量和比较。sic - mosfet的栅极焊盘占芯片尺寸的6%。与sic - sbd相比,sic - mosfet的热阻抗高55%,稳态热阻高13%。虽然栅极垫在器件芯片中只占很小的面积,但我们发现它对SiC功率模块的热阻抗有显著的影响,特别是在短时间区域。
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Effect of Gate Pad Layout on Thermal Impedance of SiC-MOSFET
In this paper, thermal impedance (Zth) of power modules which is assembled with a silicon carbide Schottky barrier diode (SiC-SBD) and metal oxide semiconductor field effect transistor (SiC-MOSFET) was measured and compared. SiC-MOSFETs had gate pads that accounted for 6% of the die size. SiC-MOSFETs had up to 55% higher thermal impedance and 13% higher steady-state thermal resistance compared to SiC-SBDs. Although the gate pad occupies only a small area in the device chip, it was found to have a significant difference on the thermal impedance of SiC power modules, especially in the short time region.
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