{"title":"vdd端接DDR5中的同步开关噪声仿真","authors":"Shinyoun Park, Vinod Arjun Huddar","doi":"10.23919/ICEP55381.2022.9795451","DOIUrl":null,"url":null,"abstract":"This paper addresses the limitations of simultaneous switching noise(SSN)simulation using loop-based power distribution network (PDN) model such as s-parameter in VDD-terminated DDR5 and proposes the simulation using partial element equivalent circuit(PEEC)-based PDN model for the system.","PeriodicalId":413776,"journal":{"name":"2022 International Conference on Electronics Packaging (ICEP)","volume":"464 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2022-05-11","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":"{\"title\":\"Simultaneous Switching Noise Simulation in VDD-Terminated DDR5\",\"authors\":\"Shinyoun Park, Vinod Arjun Huddar\",\"doi\":\"10.23919/ICEP55381.2022.9795451\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"This paper addresses the limitations of simultaneous switching noise(SSN)simulation using loop-based power distribution network (PDN) model such as s-parameter in VDD-terminated DDR5 and proposes the simulation using partial element equivalent circuit(PEEC)-based PDN model for the system.\",\"PeriodicalId\":413776,\"journal\":{\"name\":\"2022 International Conference on Electronics Packaging (ICEP)\",\"volume\":\"464 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2022-05-11\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"0\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"2022 International Conference on Electronics Packaging (ICEP)\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.23919/ICEP55381.2022.9795451\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"2022 International Conference on Electronics Packaging (ICEP)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.23919/ICEP55381.2022.9795451","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
Simultaneous Switching Noise Simulation in VDD-Terminated DDR5
This paper addresses the limitations of simultaneous switching noise(SSN)simulation using loop-based power distribution network (PDN) model such as s-parameter in VDD-terminated DDR5 and proposes the simulation using partial element equivalent circuit(PEEC)-based PDN model for the system.
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