{"title":"采用集成矢量信号分析仪的内置自检相控阵RFIC","authors":"O. Inac, Donghyup Shin, Gabriel M. Rebeiz","doi":"10.1109/CSICS.2011.6062488","DOIUrl":null,"url":null,"abstract":"An X-band phased-array RF integrated circuit with built-in self-test (BIST) capabilities is presented. The BIST is accomplished using a miniature capacitive coupler at the input of each channel and an on-chip I/Q vector receiver. Measurements done with BIST system agree well with S-parameter data and provide the amplitude and phase response over phase states and over frequency. To our knowledge, this is the first implementation of an on-chip BIST and with high accuracy.","PeriodicalId":275064,"journal":{"name":"2011 IEEE Compound Semiconductor Integrated Circuit Symposium (CSICS)","volume":"30 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2011-11-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"2","resultStr":"{\"title\":\"A Phased Array RFIC with Built-In Self-Test Using an Integrated Vector Signal Analyzer\",\"authors\":\"O. Inac, Donghyup Shin, Gabriel M. Rebeiz\",\"doi\":\"10.1109/CSICS.2011.6062488\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"An X-band phased-array RF integrated circuit with built-in self-test (BIST) capabilities is presented. The BIST is accomplished using a miniature capacitive coupler at the input of each channel and an on-chip I/Q vector receiver. Measurements done with BIST system agree well with S-parameter data and provide the amplitude and phase response over phase states and over frequency. To our knowledge, this is the first implementation of an on-chip BIST and with high accuracy.\",\"PeriodicalId\":275064,\"journal\":{\"name\":\"2011 IEEE Compound Semiconductor Integrated Circuit Symposium (CSICS)\",\"volume\":\"30 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2011-11-01\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"2\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"2011 IEEE Compound Semiconductor Integrated Circuit Symposium (CSICS)\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/CSICS.2011.6062488\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"2011 IEEE Compound Semiconductor Integrated Circuit Symposium (CSICS)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/CSICS.2011.6062488","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
A Phased Array RFIC with Built-In Self-Test Using an Integrated Vector Signal Analyzer
An X-band phased-array RF integrated circuit with built-in self-test (BIST) capabilities is presented. The BIST is accomplished using a miniature capacitive coupler at the input of each channel and an on-chip I/Q vector receiver. Measurements done with BIST system agree well with S-parameter data and provide the amplitude and phase response over phase states and over frequency. To our knowledge, this is the first implementation of an on-chip BIST and with high accuracy.
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