美国国家航空航天局戈达德太空飞行中心和美国国家航空航天局电子零件和包装计划的当前总电离剂量和位移损伤结果汇编

2017 IEEE Radiation Effects Data Workshop (REDW) Pub Date : 2017-07-17 DOI:10.1109/NSREC.2017.8115431

Alyson D. Topper, M. Campola, Dakai Chen, M. Casey, K. Yau, Donna J. Cochran, K. Label, Raymond L. Ladbury, Tim Mondy, M. O’Bryan, J. Pellish, E. Wilcox, E. Wyrwas, M. Xapsos

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引用次数: 6

摘要

进行了总电离剂量和位移损伤试验，以表征和确定候选电子设备对NASA空间利用的适用性。测试的器件包括光电子、数字、模拟、线性双极器件和混合器件。

本文章由计算机程序翻译，如有差异，请以英文原文为准。

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Compendium of current total ionizing dose and displacement damage results from NASA goddard space flight center and NASA electronic parts and packaging program

Total ionizing dose and displacement damage testing was performed to characterize and determine the suitability of candidate electronics for NASA space utilization. Devices tested include optoelectronics, digital, analog, linear bipolar devices, and hybrid devices.

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2017 IEEE Radiation Effects Data Workshop (REDW)

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