M. Marchetti, M. Pelk, K. Buisman, M. Spirito, L. D. de Vreede
{"title":"用于高动态范围等温测量的脉冲网络分析仪","authors":"M. Marchetti, M. Pelk, K. Buisman, M. Spirito, L. D. de Vreede","doi":"10.1109/ARFTG.2006.8361670","DOIUrl":null,"url":null,"abstract":"A low-cost, high-performance vector network analyzer approach for pulsed operation is presented. The proposed setup offers a very high dynamic range which is independent of the measurement pulse width or duty cycle. As result, the presented network analyzer configuration is perfectly suited for the isothermal characterization of RF semiconductor devices and outperforms current commercially available solutions for this purpose in dynamic range and measurement speed.","PeriodicalId":302468,"journal":{"name":"2006 68th ARFTG Conference: Microwave Measurement","volume":"16 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2006-11-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"4","resultStr":"{\"title\":\"A pulsed network analyzer for high dynamic range isothermal measurements\",\"authors\":\"M. Marchetti, M. Pelk, K. Buisman, M. Spirito, L. D. de Vreede\",\"doi\":\"10.1109/ARFTG.2006.8361670\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"A low-cost, high-performance vector network analyzer approach for pulsed operation is presented. The proposed setup offers a very high dynamic range which is independent of the measurement pulse width or duty cycle. As result, the presented network analyzer configuration is perfectly suited for the isothermal characterization of RF semiconductor devices and outperforms current commercially available solutions for this purpose in dynamic range and measurement speed.\",\"PeriodicalId\":302468,\"journal\":{\"name\":\"2006 68th ARFTG Conference: Microwave Measurement\",\"volume\":\"16 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2006-11-01\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"4\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"2006 68th ARFTG Conference: Microwave Measurement\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/ARFTG.2006.8361670\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"2006 68th ARFTG Conference: Microwave Measurement","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/ARFTG.2006.8361670","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
A pulsed network analyzer for high dynamic range isothermal measurements
A low-cost, high-performance vector network analyzer approach for pulsed operation is presented. The proposed setup offers a very high dynamic range which is independent of the measurement pulse width or duty cycle. As result, the presented network analyzer configuration is perfectly suited for the isothermal characterization of RF semiconductor devices and outperforms current commercially available solutions for this purpose in dynamic range and measurement speed.
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