各种柔性芯片(COF)封装方法的研究

Kyoung-Lim Suk, Jong-Soo Kim, K. Paik
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引用次数: 0

摘要

采用ACF和NCF胶粘剂以及AuSn冶金粘接方法,研究了不同的2金属柔性(2金属COF)封装方法在电气特性、倒装芯片连接质量和可靠性性能方面的性能。2金属挠性基板和测试芯片的设计包括不同的螺距,35um, 25um和20um。通过热循环试验(TC试验,−40°C ~ +125°C, 1000次循环)和高温储存试验(HTS试验,125°C, 1000小时),验证了不同键合方式下2金属COF封装的可靠性。所有COF封装均表现出良好的TC和HTS可靠性,而在可靠性测试中,仅在ACF接头的20um节距处观察到电短接头。因此,对于间距小于20um的2金属COF封装,推荐使用NCF粘合剂粘合和AuSn冶金粘合方法,而对于间距大于25um的应用,可以使用所有ACF和NCF粘合剂粘合和AuSn冶金粘合方法。
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Studies on various 2-metal chip-on-flex (COF) packaging methods
Various chip-on-2-metal flex (2-metal COF) packaging methods using such as ACF and NCF adhesives, and AuSn metallurgical bonding methods, were investigated in terms of electrical characteristics, flip chip joint quality, and reliability performances. 2-metal flex substrate and test chip were designed to include different pitches, 35 um, 25 um, and 20 um pitch. Thermal cycling test (TC test, −40 °C ~ +125 °C, 1000 cycles), and high temperature storage test (HTS test, 125 °C, 1000 hrs) were conducted to verify reliability of the 2-metal COF packages by various bonding methods. All the COF packages showed good TC and HTS reliability, whereas electrically shorted joints were observed during reliability tests only at the 20 um pitch of ACF joints. Therefore, for less than 20 um pitch of 2-metal COF packages, NCF adhesives bonding and AuSn metallurgical bonding methods are recommended, while all the ACF and NCF adhesives bonding and AuSn metallurgical bonding methods can be applied for larger than 25 um pitch applications.
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