高精度SAR adc的单事件效应测试方法

2021 IEEE Nuclear and Space Radiation Effects Conference (NSREC) Pub Date : 2021-07-01 DOI:10.1109/NSREC45046.2021.9679355

J. Harris, L. Pearce, N. V. van Vonno, E. Thomson

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摘要

我们描述了一种测试方法，以充分识别无用户可配置寄存器的精密SAR adc中的单事件效应(SEE)，即单事件瞬态(SET)和单事件功能中断(SEFI)。

本文章由计算机程序翻译，如有差异，请以英文原文为准。

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Single-Event Effects Test Methodology for Precision SAR ADCs

We describe a test methodology to adequately identify single event effects (SEE), namely single event transients (SET) and single event functional interrupts (SEFI) in precision SAR ADCs without user configurable registers.

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2021 IEEE Nuclear and Space Radiation Effects Conference (NSREC)

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