使用非周期时钟减少测试时间的ATE频率的最佳选择

2014 IEEE 23rd North Atlantic Test Workshop Pub Date : 2014-05-14 DOI:10.1109/NATW.2014.19

S. Gunasekar, V. Agrawal

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引用次数: 1

摘要

最近提出了一种减少晶圆分选测试时间的非周期测试时钟方法。然而，在实践中，自动测试设备(ATE)只允许少量时钟周期，并且找到这些时钟周期在数学上是一个复杂的问题。本文提出了一种任意给定数量的测试仪时钟周期的最优选择算法。

本文章由计算机程序翻译，如有差异，请以英文原文为准。

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Optimal Selection of ATE Frequencies for Test Time Reduction Using Aperiodic Clock

An aperiodic test clock methodology to reduce test time of wafer sort has been recently proposed. In practice, however, an automatic test equipment (ATE) allows only a small number of clock periods and finding those is a mathematically complex problem. This paper proposes an algorithm for optimal selection of any given number of tester clock periods.

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2014 IEEE 23rd North Atlantic Test Workshop

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