{"title":"用边界扫描电路评价封装开关噪声","authors":"E. Games, U. Shrivastava, J. Liao","doi":"10.1109/ECTC.1996.517466","DOIUrl":null,"url":null,"abstract":"This paper describes a method for evaluating simultaneous switching noise (SSN) of microprocessors. To control the switching of I/O buffers, the boundary scan architecture implemented on processors is employed. For this experiment, the on die periphery power supply noise was measured with up to 130 simultaneously switching output buffers. The method of exercising the device is described and the results of SSN measurement are presented.","PeriodicalId":143519,"journal":{"name":"1996 Proceedings 46th Electronic Components and Technology Conference","volume":"7 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"1996-05-28","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":"{\"title\":\"Package switching noise evaluation using boundary scan circuitry\",\"authors\":\"E. Games, U. Shrivastava, J. Liao\",\"doi\":\"10.1109/ECTC.1996.517466\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"This paper describes a method for evaluating simultaneous switching noise (SSN) of microprocessors. To control the switching of I/O buffers, the boundary scan architecture implemented on processors is employed. For this experiment, the on die periphery power supply noise was measured with up to 130 simultaneously switching output buffers. The method of exercising the device is described and the results of SSN measurement are presented.\",\"PeriodicalId\":143519,\"journal\":{\"name\":\"1996 Proceedings 46th Electronic Components and Technology Conference\",\"volume\":\"7 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"1996-05-28\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"0\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"1996 Proceedings 46th Electronic Components and Technology Conference\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/ECTC.1996.517466\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"1996 Proceedings 46th Electronic Components and Technology Conference","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/ECTC.1996.517466","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
Package switching noise evaluation using boundary scan circuitry
This paper describes a method for evaluating simultaneous switching noise (SSN) of microprocessors. To control the switching of I/O buffers, the boundary scan architecture implemented on processors is employed. For this experiment, the on die periphery power supply noise was measured with up to 130 simultaneously switching output buffers. The method of exercising the device is described and the results of SSN measurement are presented.
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