YHFT-DV数字信号处理器的辐射硬度评价

2017 IEEE Radiation Effects Data Workshop (REDW) Pub Date : 2017-07-01 DOI:10.1109/NSREC.2017.8115440

Yaqing Chi, Bin Liang, YongJie Sun, Yang Guo, Shuming Chen

{"title":"YHFT-DV数字信号处理器的辐射硬度评价","authors":"Yaqing Chi, Bin Liang, YongJie Sun, Yang Guo, Shuming Chen","doi":"10.1109/NSREC.2017.8115440","DOIUrl":null,"url":null,"abstract":"The Total Ionizing Dose and Single Event Effects test results of YHFT-DV, a 32-bit floating-point digital signal processor are reported in this paper. The result shows the DSP is well radiation hardened.","PeriodicalId":284506,"journal":{"name":"2017 IEEE Radiation Effects Data Workshop (REDW)","volume":"7 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2017-07-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":"{\"title\":\"Radiation hardness evaluation of the YHFT-DV digital signal processor\",\"authors\":\"Yaqing Chi, Bin Liang, YongJie Sun, Yang Guo, Shuming Chen\",\"doi\":\"10.1109/NSREC.2017.8115440\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"The Total Ionizing Dose and Single Event Effects test results of YHFT-DV, a 32-bit floating-point digital signal processor are reported in this paper. The result shows the DSP is well radiation hardened.\",\"PeriodicalId\":284506,\"journal\":{\"name\":\"2017 IEEE Radiation Effects Data Workshop (REDW)\",\"volume\":\"7 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2017-07-01\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"0\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"2017 IEEE Radiation Effects Data Workshop (REDW)\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/NSREC.2017.8115440\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"2017 IEEE Radiation Effects Data Workshop (REDW)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/NSREC.2017.8115440","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}

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摘要

本文报道了32位浮点数字信号处理器YHFT-DV的总电离剂量和单事件效应的测试结果。结果表明，该DSP具有良好的抗辐射性能。

本文章由计算机程序翻译，如有差异，请以英文原文为准。

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Radiation hardness evaluation of the YHFT-DV digital signal processor

The Total Ionizing Dose and Single Event Effects test results of YHFT-DV, a 32-bit floating-point digital signal processor are reported in this paper. The result shows the DSP is well radiation hardened.

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2017 IEEE Radiation Effects Data Workshop (REDW)

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