印刷电路板组件中两引脚间微短路失效分析

Chao-Kun Hu, Lina Zhou
{"title":"印刷电路板组件中两引脚间微短路失效分析","authors":"Chao-Kun Hu, Lina Zhou","doi":"10.1109/ICRMS.2016.8050164","DOIUrl":null,"url":null,"abstract":"Function failure was found successively in one type of smart remote controls when using a period of time. With preliminary investigation by electric circuit, low resistance was found between the neighboring pins on failure sample which connected with flexible printed board and rigid printed board, but the pins on good sample were insulated with the others. After peeling off the flexible printed board, black materials which looked like migration were found by stereomicroscope and metallography microscope. With the help of scanning electron microscope and energy dispersive spectroscope (SEM&EDS), it was detected that the materials mainly contained the elements of Cu (about 50 at.%) and S (about 30 at.%), and the two short pins were almost connected with the black materials. As a result, the black materials which connected to the two pins should be copper sulfide (CuS) and cuprous sulfide (Cu2S). The failure process was as the follows. Some active sulfide was on the surface of board, with the bias voltage and moisture, the copper on the pads of board was sulfurized and migrated with electrochemical reaction. The migration materials which connected to the neighboring pins cause micro-short circuit. However, there was no element of Cu on the clean solder mask, and the element of S could not come from the filling material barium sulfate (BaSO4) because barium sulfate were difficult to break down and the element of Ba had not been detected in the black materials. Finally, with further investigation for the manufacturing process of the assembly, the element of S was detected on copper foil after soldering with the solder paste which used in the failure sample, but the element of S could not be detected with the other type of solder paste. It could conclude that the active sulfide should come from some sulfur-containing materials in the flux of solder paste breaking down in soldering. When soldering, the solvent in the flux was difficult to volatilize due to the flexible printed circuit board (FPC) on the top. Some sulfur-containing materials in the solvent would decompose to active sulfide. So, in order to avoid the failure of micro-short, the solder paste without sulfur containing should be used in soldering.","PeriodicalId":347031,"journal":{"name":"2016 11th International Conference on Reliability, Maintainability and Safety (ICRMS)","volume":null,"pages":null},"PeriodicalIF":0.0000,"publicationDate":"2016-10-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"2","resultStr":"{\"title\":\"Failure analysis for micro-short circuit between two pins in printed circuit board assembly\",\"authors\":\"Chao-Kun Hu, Lina Zhou\",\"doi\":\"10.1109/ICRMS.2016.8050164\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"Function failure was found successively in one type of smart remote controls when using a period of time. With preliminary investigation by electric circuit, low resistance was found between the neighboring pins on failure sample which connected with flexible printed board and rigid printed board, but the pins on good sample were insulated with the others. After peeling off the flexible printed board, black materials which looked like migration were found by stereomicroscope and metallography microscope. With the help of scanning electron microscope and energy dispersive spectroscope (SEM&EDS), it was detected that the materials mainly contained the elements of Cu (about 50 at.%) and S (about 30 at.%), and the two short pins were almost connected with the black materials. As a result, the black materials which connected to the two pins should be copper sulfide (CuS) and cuprous sulfide (Cu2S). The failure process was as the follows. Some active sulfide was on the surface of board, with the bias voltage and moisture, the copper on the pads of board was sulfurized and migrated with electrochemical reaction. The migration materials which connected to the neighboring pins cause micro-short circuit. However, there was no element of Cu on the clean solder mask, and the element of S could not come from the filling material barium sulfate (BaSO4) because barium sulfate were difficult to break down and the element of Ba had not been detected in the black materials. Finally, with further investigation for the manufacturing process of the assembly, the element of S was detected on copper foil after soldering with the solder paste which used in the failure sample, but the element of S could not be detected with the other type of solder paste. It could conclude that the active sulfide should come from some sulfur-containing materials in the flux of solder paste breaking down in soldering. When soldering, the solvent in the flux was difficult to volatilize due to the flexible printed circuit board (FPC) on the top. Some sulfur-containing materials in the solvent would decompose to active sulfide. So, in order to avoid the failure of micro-short, the solder paste without sulfur containing should be used in soldering.\",\"PeriodicalId\":347031,\"journal\":{\"name\":\"2016 11th International Conference on Reliability, Maintainability and Safety (ICRMS)\",\"volume\":null,\"pages\":null},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2016-10-01\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"2\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"2016 11th International Conference on Reliability, Maintainability and Safety (ICRMS)\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/ICRMS.2016.8050164\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"2016 11th International Conference on Reliability, Maintainability and Safety (ICRMS)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/ICRMS.2016.8050164","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 2

摘要

某型号智能遥控器在使用一段时间后陆续出现功能故障。电路初步调查发现,在与柔性印制板和刚性印制板连接的故障样品上,相邻引脚之间的电阻较低,而良好样品上的引脚与其他引脚绝缘。剥去柔性印制板后,用体视显微镜和金相显微镜观察,发现有迁移样的黑色物质。利用扫描电镜和能谱仪(SEM&EDS)检测到材料主要含有Cu(约50 at.%)和S(约30 at.%)元素,两个短引脚几乎与黑色材料相连。因此,连接两个引脚的黑色材料应该是硫化铜(cu)和硫化亚铜(Cu2S)。失败的过程如下。在偏置电压和湿气的作用下,电路板表面的铜发生了电化学硫化迁移。与相邻引脚连接的迁移材料会引起微短路。然而,干净的阻焊膜上没有Cu元素,并且S元素不可能来自填充材料硫酸钡(BaSO4),因为硫酸钡难以分解,并且在黑色材料中未检测到Ba元素。最后,通过对组件制造工艺的进一步研究,用失效样品中使用的锡膏焊接后,在铜箔上检测到S元素,而使用其他类型的锡膏则无法检测到S元素。由此可以得出结论,活性硫化物应该来自焊接过程中锡膏助焊剂中某些含硫物质的分解。焊接时,由于焊剂顶部有柔性印刷电路板(FPC),焊剂中的溶剂很难挥发。一些含硫物质在溶剂中会分解为活性硫化物。所以,为了避免微短故障,在焊接时应使用不含硫的锡膏。
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Failure analysis for micro-short circuit between two pins in printed circuit board assembly
Function failure was found successively in one type of smart remote controls when using a period of time. With preliminary investigation by electric circuit, low resistance was found between the neighboring pins on failure sample which connected with flexible printed board and rigid printed board, but the pins on good sample were insulated with the others. After peeling off the flexible printed board, black materials which looked like migration were found by stereomicroscope and metallography microscope. With the help of scanning electron microscope and energy dispersive spectroscope (SEM&EDS), it was detected that the materials mainly contained the elements of Cu (about 50 at.%) and S (about 30 at.%), and the two short pins were almost connected with the black materials. As a result, the black materials which connected to the two pins should be copper sulfide (CuS) and cuprous sulfide (Cu2S). The failure process was as the follows. Some active sulfide was on the surface of board, with the bias voltage and moisture, the copper on the pads of board was sulfurized and migrated with electrochemical reaction. The migration materials which connected to the neighboring pins cause micro-short circuit. However, there was no element of Cu on the clean solder mask, and the element of S could not come from the filling material barium sulfate (BaSO4) because barium sulfate were difficult to break down and the element of Ba had not been detected in the black materials. Finally, with further investigation for the manufacturing process of the assembly, the element of S was detected on copper foil after soldering with the solder paste which used in the failure sample, but the element of S could not be detected with the other type of solder paste. It could conclude that the active sulfide should come from some sulfur-containing materials in the flux of solder paste breaking down in soldering. When soldering, the solvent in the flux was difficult to volatilize due to the flexible printed circuit board (FPC) on the top. Some sulfur-containing materials in the solvent would decompose to active sulfide. So, in order to avoid the failure of micro-short, the solder paste without sulfur containing should be used in soldering.
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