{"title":"先进晶圆级封装技术的挑战:成本效益、集成和可扩展性","authors":"S. Yoon","doi":"10.1109/EPTC.2012.6507126","DOIUrl":null,"url":null,"abstract":"Currently various wafer level packaging (WLP) technologies are now cruising at a very high altitude, especially in mobile and portable applications. This is significant trend in packaging business: over 25 billion WLP units are expected to be mounted in smart-phones, tablet PCs or portable devices in 2012. Cost reduction together with miniaturization remains the main driver for adoption of WLP technology. Compared to conventional wire bonding and flipchip packaging, wafer level packaging needs higher capex investment because it has fab-like tools for redistribution process with thin film metals and dielectric polymers. Further cost reduction is a critical factor for penetration into market beyond current market boundaries. And WLP size is increasing with higher IO density and integration of functionality, so board level reliability would be key challenge for moving into broader application areas. In this paper, there will be discussion of technical challenges and market needs of advanced wafer level packaging technology, including fan-in, fan-out (FO), bumping and TSV (Silicon Through Via) etc. And potential solutions and industry approach for those challenges will be presented. Some deeper insights on business opportunities and cost reduction approaches in wafer level packaging in materials and processes will be presented. Lastly new trend of wafer level packaging technology will be discussed including large panel or scalability for high volume production.","PeriodicalId":431312,"journal":{"name":"2012 IEEE 14th Electronics Packaging Technology Conference (EPTC)","volume":"23 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2012-12-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"7","resultStr":"{\"title\":\"Challenges of advanced wafer level packaging technology: Cost-effectiveness, integration and scalability\",\"authors\":\"S. Yoon\",\"doi\":\"10.1109/EPTC.2012.6507126\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"Currently various wafer level packaging (WLP) technologies are now cruising at a very high altitude, especially in mobile and portable applications. This is significant trend in packaging business: over 25 billion WLP units are expected to be mounted in smart-phones, tablet PCs or portable devices in 2012. Cost reduction together with miniaturization remains the main driver for adoption of WLP technology. Compared to conventional wire bonding and flipchip packaging, wafer level packaging needs higher capex investment because it has fab-like tools for redistribution process with thin film metals and dielectric polymers. Further cost reduction is a critical factor for penetration into market beyond current market boundaries. And WLP size is increasing with higher IO density and integration of functionality, so board level reliability would be key challenge for moving into broader application areas. In this paper, there will be discussion of technical challenges and market needs of advanced wafer level packaging technology, including fan-in, fan-out (FO), bumping and TSV (Silicon Through Via) etc. And potential solutions and industry approach for those challenges will be presented. Some deeper insights on business opportunities and cost reduction approaches in wafer level packaging in materials and processes will be presented. Lastly new trend of wafer level packaging technology will be discussed including large panel or scalability for high volume production.\",\"PeriodicalId\":431312,\"journal\":{\"name\":\"2012 IEEE 14th Electronics Packaging Technology Conference (EPTC)\",\"volume\":\"23 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2012-12-01\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"7\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"2012 IEEE 14th Electronics Packaging Technology Conference (EPTC)\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/EPTC.2012.6507126\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"2012 IEEE 14th Electronics Packaging Technology Conference (EPTC)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/EPTC.2012.6507126","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 7
摘要
目前,各种晶圆级封装(WLP)技术正在非常高的高度巡航,特别是在移动和便携式应用中。这是包装行业的一个重要趋势:2012年,预计将有超过250亿WLP设备被安装在智能手机、平板电脑或便携式设备上。降低成本和小型化仍然是WLP技术采用的主要动力。与传统的线键合和倒装芯片封装相比,晶圆级封装需要更高的资本支出,因为它需要类似于晶圆厂的工具来重新分配薄膜金属和介电聚合物。进一步降低成本是突破当前市场边界进入市场的关键因素。随着IO密度的提高和功能的集成,WLP尺寸也在不断增加,因此板级可靠性将是进入更广泛应用领域的关键挑战。本文将讨论先进晶圆级封装技术的技术挑战和市场需求,包括扇入,扇出(FO),碰撞和TSV (Silicon Through Via)等。并将介绍应对这些挑战的潜在解决方案和行业方法。我们将介绍晶圆级封装材料和工艺的商业机会和降低成本的方法。最后,将讨论晶圆级封装技术的新趋势,包括大面板或大批量生产的可扩展性。
Challenges of advanced wafer level packaging technology: Cost-effectiveness, integration and scalability
Currently various wafer level packaging (WLP) technologies are now cruising at a very high altitude, especially in mobile and portable applications. This is significant trend in packaging business: over 25 billion WLP units are expected to be mounted in smart-phones, tablet PCs or portable devices in 2012. Cost reduction together with miniaturization remains the main driver for adoption of WLP technology. Compared to conventional wire bonding and flipchip packaging, wafer level packaging needs higher capex investment because it has fab-like tools for redistribution process with thin film metals and dielectric polymers. Further cost reduction is a critical factor for penetration into market beyond current market boundaries. And WLP size is increasing with higher IO density and integration of functionality, so board level reliability would be key challenge for moving into broader application areas. In this paper, there will be discussion of technical challenges and market needs of advanced wafer level packaging technology, including fan-in, fan-out (FO), bumping and TSV (Silicon Through Via) etc. And potential solutions and industry approach for those challenges will be presented. Some deeper insights on business opportunities and cost reduction approaches in wafer level packaging in materials and processes will be presented. Lastly new trend of wafer level packaging technology will be discussed including large panel or scalability for high volume production.