先进晶圆级封装技术的挑战:成本效益、集成和可扩展性

S. Yoon
{"title":"先进晶圆级封装技术的挑战:成本效益、集成和可扩展性","authors":"S. Yoon","doi":"10.1109/EPTC.2012.6507126","DOIUrl":null,"url":null,"abstract":"Currently various wafer level packaging (WLP) technologies are now cruising at a very high altitude, especially in mobile and portable applications. This is significant trend in packaging business: over 25 billion WLP units are expected to be mounted in smart-phones, tablet PCs or portable devices in 2012. Cost reduction together with miniaturization remains the main driver for adoption of WLP technology. Compared to conventional wire bonding and flipchip packaging, wafer level packaging needs higher capex investment because it has fab-like tools for redistribution process with thin film metals and dielectric polymers. Further cost reduction is a critical factor for penetration into market beyond current market boundaries. And WLP size is increasing with higher IO density and integration of functionality, so board level reliability would be key challenge for moving into broader application areas. In this paper, there will be discussion of technical challenges and market needs of advanced wafer level packaging technology, including fan-in, fan-out (FO), bumping and TSV (Silicon Through Via) etc. And potential solutions and industry approach for those challenges will be presented. Some deeper insights on business opportunities and cost reduction approaches in wafer level packaging in materials and processes will be presented. Lastly new trend of wafer level packaging technology will be discussed including large panel or scalability for high volume production.","PeriodicalId":431312,"journal":{"name":"2012 IEEE 14th Electronics Packaging Technology Conference (EPTC)","volume":"23 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2012-12-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"7","resultStr":"{\"title\":\"Challenges of advanced wafer level packaging technology: Cost-effectiveness, integration and scalability\",\"authors\":\"S. Yoon\",\"doi\":\"10.1109/EPTC.2012.6507126\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"Currently various wafer level packaging (WLP) technologies are now cruising at a very high altitude, especially in mobile and portable applications. This is significant trend in packaging business: over 25 billion WLP units are expected to be mounted in smart-phones, tablet PCs or portable devices in 2012. Cost reduction together with miniaturization remains the main driver for adoption of WLP technology. Compared to conventional wire bonding and flipchip packaging, wafer level packaging needs higher capex investment because it has fab-like tools for redistribution process with thin film metals and dielectric polymers. Further cost reduction is a critical factor for penetration into market beyond current market boundaries. And WLP size is increasing with higher IO density and integration of functionality, so board level reliability would be key challenge for moving into broader application areas. In this paper, there will be discussion of technical challenges and market needs of advanced wafer level packaging technology, including fan-in, fan-out (FO), bumping and TSV (Silicon Through Via) etc. And potential solutions and industry approach for those challenges will be presented. Some deeper insights on business opportunities and cost reduction approaches in wafer level packaging in materials and processes will be presented. Lastly new trend of wafer level packaging technology will be discussed including large panel or scalability for high volume production.\",\"PeriodicalId\":431312,\"journal\":{\"name\":\"2012 IEEE 14th Electronics Packaging Technology Conference (EPTC)\",\"volume\":\"23 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2012-12-01\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"7\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"2012 IEEE 14th Electronics Packaging Technology Conference (EPTC)\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/EPTC.2012.6507126\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"2012 IEEE 14th Electronics Packaging Technology Conference (EPTC)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/EPTC.2012.6507126","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 7

摘要

目前,各种晶圆级封装(WLP)技术正在非常高的高度巡航,特别是在移动和便携式应用中。这是包装行业的一个重要趋势:2012年,预计将有超过250亿WLP设备被安装在智能手机、平板电脑或便携式设备上。降低成本和小型化仍然是WLP技术采用的主要动力。与传统的线键合和倒装芯片封装相比,晶圆级封装需要更高的资本支出,因为它需要类似于晶圆厂的工具来重新分配薄膜金属和介电聚合物。进一步降低成本是突破当前市场边界进入市场的关键因素。随着IO密度的提高和功能的集成,WLP尺寸也在不断增加,因此板级可靠性将是进入更广泛应用领域的关键挑战。本文将讨论先进晶圆级封装技术的技术挑战和市场需求,包括扇入,扇出(FO),碰撞和TSV (Silicon Through Via)等。并将介绍应对这些挑战的潜在解决方案和行业方法。我们将介绍晶圆级封装材料和工艺的商业机会和降低成本的方法。最后,将讨论晶圆级封装技术的新趋势,包括大面板或大批量生产的可扩展性。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
查看原文
分享 分享
微信好友 朋友圈 QQ好友 复制链接
本刊更多论文
Challenges of advanced wafer level packaging technology: Cost-effectiveness, integration and scalability
Currently various wafer level packaging (WLP) technologies are now cruising at a very high altitude, especially in mobile and portable applications. This is significant trend in packaging business: over 25 billion WLP units are expected to be mounted in smart-phones, tablet PCs or portable devices in 2012. Cost reduction together with miniaturization remains the main driver for adoption of WLP technology. Compared to conventional wire bonding and flipchip packaging, wafer level packaging needs higher capex investment because it has fab-like tools for redistribution process with thin film metals and dielectric polymers. Further cost reduction is a critical factor for penetration into market beyond current market boundaries. And WLP size is increasing with higher IO density and integration of functionality, so board level reliability would be key challenge for moving into broader application areas. In this paper, there will be discussion of technical challenges and market needs of advanced wafer level packaging technology, including fan-in, fan-out (FO), bumping and TSV (Silicon Through Via) etc. And potential solutions and industry approach for those challenges will be presented. Some deeper insights on business opportunities and cost reduction approaches in wafer level packaging in materials and processes will be presented. Lastly new trend of wafer level packaging technology will be discussed including large panel or scalability for high volume production.
求助全文
通过发布文献求助,成功后即可免费获取论文全文。 去求助
来源期刊
自引率
0.00%
发文量
0
期刊最新文献
Mechanical characterization of wafer level bump-less Cu-Cu bonding Process development to enable die sorting and 3D IC stacking Analysis of cracking in brittle substrate Through-Silicon Interposer (TSI) co-design optimization for high performance systems Effect of thermomechanical fatigue on drop impact properties of Sn-Ag-Cu lead-free solder joints
×
引用
GB/T 7714-2015
复制
MLA
复制
APA
复制
导出至
BibTeX EndNote RefMan NoteFirst NoteExpress
×
×
提示
您的信息不完整,为了账户安全,请先补充。
现在去补充
×
提示
您因"违规操作"
具体请查看互助需知
我知道了
×
提示
现在去查看 取消
×
提示
确定
0
微信
客服QQ
Book学术公众号 扫码关注我们
反馈
×
意见反馈
请填写您的意见或建议
请填写您的手机或邮箱
已复制链接
已复制链接
快去分享给好友吧!
我知道了
×
扫码分享
扫码分享
Book学术官方微信
Book学术文献互助
Book学术文献互助群
群 号:481959085
Book学术
文献互助 智能选刊 最新文献 互助须知 联系我们:info@booksci.cn
Book学术提供免费学术资源搜索服务,方便国内外学者检索中英文文献。致力于提供最便捷和优质的服务体验。
Copyright © 2023 Book学术 All rights reserved.
ghs 京公网安备 11010802042870号 京ICP备2023020795号-1