{"title":"用于多音信号分析的射频/微波电路非线性建模","authors":"J. Pedro, N. Carvalho","doi":"10.1109/ARFTG.2001.327483","DOIUrl":null,"url":null,"abstract":"Supported on the theoretical framework of Volterra Series, the present paper discusses nonlinear model extraction procedures currently in use for multi-tone signal analysis, and proposes a methodology that has been successfully applied to small and large-signal distortion regimes of microwave circuits. Good agreement between nonlinear simulation results and laboratory measurements of a medium power amplifier driven with band-limited white noise, validated the authors¿ approach.","PeriodicalId":331830,"journal":{"name":"58th ARFTG Conference Digest","volume":null,"pages":null},"PeriodicalIF":0.0000,"publicationDate":"2001-11-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"1","resultStr":"{\"title\":\"Nonlinear Modeling of RF/Microwave Circuits for Multi-Tone Signal Analysis\",\"authors\":\"J. Pedro, N. Carvalho\",\"doi\":\"10.1109/ARFTG.2001.327483\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"Supported on the theoretical framework of Volterra Series, the present paper discusses nonlinear model extraction procedures currently in use for multi-tone signal analysis, and proposes a methodology that has been successfully applied to small and large-signal distortion regimes of microwave circuits. Good agreement between nonlinear simulation results and laboratory measurements of a medium power amplifier driven with band-limited white noise, validated the authors¿ approach.\",\"PeriodicalId\":331830,\"journal\":{\"name\":\"58th ARFTG Conference Digest\",\"volume\":null,\"pages\":null},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2001-11-01\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"1\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"58th ARFTG Conference Digest\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/ARFTG.2001.327483\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"58th ARFTG Conference Digest","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/ARFTG.2001.327483","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
Nonlinear Modeling of RF/Microwave Circuits for Multi-Tone Signal Analysis
Supported on the theoretical framework of Volterra Series, the present paper discusses nonlinear model extraction procedures currently in use for multi-tone signal analysis, and proposes a methodology that has been successfully applied to small and large-signal distortion regimes of microwave circuits. Good agreement between nonlinear simulation results and laboratory measurements of a medium power amplifier driven with band-limited white noise, validated the authors¿ approach.
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