通用的,直接芯片贴装MEMS封装设计,具有高密度和纵横比通过晶圆电互连

Seong Joon Ok, J. Neysmith, D. Baldwin
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引用次数: 5

摘要

微机电系统(MEMS)是结合电气和机械部件的集成系统,采用集成电路(IC)批量加工技术制造。MEMS的影响力是通过其在功能、尺寸和可靠性方面的优势而成为可能的。尽管在微系统制造领域取得了这些令人瞩目和充满希望的成就,但经过验证的器件的商业化远远落后于预期,这在很大程度上是由于高封装成本,不当的封装设计解决方案和高测试成本。本文的重点是提出和展示一种有前途的通用、模块化、直接芯片连接(DCA)、低成本和高可靠的MEMS封装设计策略和解决方案,并应用高纵横比通晶圆电互连(TWEI)。使用干蚀刻技术制造twi是一种相对较新的技术,可以创造比任何其他传统包装设计更多更好的包装选择。对各种使晶圆通孔导电的技术进行了论证和分析,并分析了它们的优缺点。
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Generic, Direct-Chip-Attach MEMS packaging design with high density and aspect ratio Through-Wafer Electrical Interconnect
Micro-Electro-Mechanical-Systems (MEMS) are integrated systems combining electrical and mechanical components, which are fabricated using integrated circuit (IC) batch processing techniques. The influence of MEMS is made possible through their benefits in functionality, size, and reliability. In spite of these remarkable and promising achievements in the field of microsystem fabrication, the commercialization of proven devices are lagged far behind expectations, considerably due to high packaging cost, improper packaging design solution and high testing cost. This paper is focused on suggesting and demonstrating a promising generic, modular, Direct-Chip-Attach (DCA), low cost and high reliable MEMS packaging design strategy and solution applying with high aspect ratio Through-Wafer Electrical Interconnect (TWEI). Fabrication of TWEI using dry etching is relatively new technology that can create more and better packaging options than any other conventional packaging design. The various techniques that can make through-wafer vias conductive are demonstrated and analyzed with advantages and drawbacks.
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