{"title":"用设备I-V曲线创建简单的驱动程序模型","authors":"E. M. Foster","doi":"10.1109/STIER.1990.324653","DOIUrl":null,"url":null,"abstract":"A method for simulating driver performance using the characteristic static output current curves for a low state (I/sub OL/) and high state (I/sub OH/) is presented. It offers a simplified alternative to complex theoretical models. This approach can be used to quickly evaluate the impact of a change in driver output on system performance, to determine the worst case performance, or to correlate experiments directly with a given test device. It requires that the I/sub OL/ and I/sub OH/, and the intrinsic transient time for the device be known. This information can be determined by measuring hardware, analyzing the output of a theoretical model, or summarizing data sheets.<<ETX>>","PeriodicalId":166693,"journal":{"name":"IEEE Technical Conference on Southern Tier","volume":"21 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"1990-04-25","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"1","resultStr":"{\"title\":\"Creating simple driver models with device I-V curves\",\"authors\":\"E. M. Foster\",\"doi\":\"10.1109/STIER.1990.324653\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"A method for simulating driver performance using the characteristic static output current curves for a low state (I/sub OL/) and high state (I/sub OH/) is presented. It offers a simplified alternative to complex theoretical models. This approach can be used to quickly evaluate the impact of a change in driver output on system performance, to determine the worst case performance, or to correlate experiments directly with a given test device. It requires that the I/sub OL/ and I/sub OH/, and the intrinsic transient time for the device be known. This information can be determined by measuring hardware, analyzing the output of a theoretical model, or summarizing data sheets.<<ETX>>\",\"PeriodicalId\":166693,\"journal\":{\"name\":\"IEEE Technical Conference on Southern Tier\",\"volume\":\"21 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"1990-04-25\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"1\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"IEEE Technical Conference on Southern Tier\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/STIER.1990.324653\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"IEEE Technical Conference on Southern Tier","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/STIER.1990.324653","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
Creating simple driver models with device I-V curves
A method for simulating driver performance using the characteristic static output current curves for a low state (I/sub OL/) and high state (I/sub OH/) is presented. It offers a simplified alternative to complex theoretical models. This approach can be used to quickly evaluate the impact of a change in driver output on system performance, to determine the worst case performance, or to correlate experiments directly with a given test device. It requires that the I/sub OL/ and I/sub OH/, and the intrinsic transient time for the device be known. This information can be determined by measuring hardware, analyzing the output of a theoretical model, or summarizing data sheets.<>
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