{"title":"使用德州仪器的Scope架构将IEEE 1149.1兼容的边界扫描逻辑设计到ASIC中","authors":"J. Koeter","doi":"10.1109/ASIC.1990.186154","DOIUrl":null,"url":null,"abstract":"A design that was described and simulated behaviorally in Verilog, and synthesized and optimized using Synopsys, is discussed., IEEE 1149.1-compatible (Scope) logic was added to the optimized design and Mentor gate-level simulations were performed. The performance and area impact on the chip of the Scope logic is examined and synthesis is used to minimize it.<<ETX>>","PeriodicalId":126693,"journal":{"name":"Third Annual IEEE Proceedings on ASIC Seminar and Exhibit","volume":"57 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"1990-09-17","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":"{\"title\":\"Designing IEEE 1149.1 compatible boundary-scan logic into an ASIC using Texas Instrument's Scope architecture\",\"authors\":\"J. Koeter\",\"doi\":\"10.1109/ASIC.1990.186154\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"A design that was described and simulated behaviorally in Verilog, and synthesized and optimized using Synopsys, is discussed., IEEE 1149.1-compatible (Scope) logic was added to the optimized design and Mentor gate-level simulations were performed. The performance and area impact on the chip of the Scope logic is examined and synthesis is used to minimize it.<<ETX>>\",\"PeriodicalId\":126693,\"journal\":{\"name\":\"Third Annual IEEE Proceedings on ASIC Seminar and Exhibit\",\"volume\":\"57 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"1990-09-17\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"0\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"Third Annual IEEE Proceedings on ASIC Seminar and Exhibit\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/ASIC.1990.186154\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"Third Annual IEEE Proceedings on ASIC Seminar and Exhibit","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/ASIC.1990.186154","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
Designing IEEE 1149.1 compatible boundary-scan logic into an ASIC using Texas Instrument's Scope architecture
A design that was described and simulated behaviorally in Verilog, and synthesized and optimized using Synopsys, is discussed., IEEE 1149.1-compatible (Scope) logic was added to the optimized design and Mentor gate-level simulations were performed. The performance and area impact on the chip of the Scope logic is examined and synthesis is used to minimize it.<>