1200V超高速集成碳化硅MOSFET模块的设计与应用

Suxuan Guo, Liqi Zhang, Yang Lei, Xuan Li, Wensong Yu, A. Huang
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引用次数: 33

摘要

近年来,随着碳化硅(SiC)和氮化镓(GaN)等宽带隙功率器件的商业化推出,大功率和高频功率电子器件的应用越来越受到关注。SiC MOSFET的快速开关速度和高温特性打破了传统硅MOSFET的限制。然而,高dI/dt和dV/dt下的电磁干扰问题是一个不容忽视的问题。漏源极电压和门控信号的超调和振荡会导致开关击穿。本文提出了一种1200V集成SiC MOSFET模块。将超高速栅极驱动器集成到SiC MOSFET中,可以显著降低寄生电感和寄生电容,从而抑制由寄生参数引起的电磁干扰问题。因此可以在模块中采用零栅极电阻,进一步提高开关速度。集成SiC模块的开关性能优于分立封装器件。采用逆变器电平测量和组合法测量了SiC MOSFET模块的开关损耗。当漏极电流低于临界值时,可以实现零开关损耗。该模块已在1.5MHz和3.38MHz开关频率下进行了测试,以证明其高速能力。对于隔离拓扑应用,本文讨论了高频对功率密度和效率的影响。
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Design and application of a 1200V ultra-fast integrated Silicon Carbide MOSFET module
With the commercial introduction of wide bandgap power devices such as Silicon Carbide (SiC) and Gallium Nitride (GaN) in the last few years, the high power and high frequency power electronics applications have gained more attention. The fast switching speed and high temperature features of SiC MOSFET break the limit of the traditional silicon MOSFET. However, the EMI problem under high dI/dt and dV/dt is an unneglectable problem. The overshoot and oscillation on drain-source voltage and gating signal could cause breakdown of the switches. This paper proposes a 1200V integrated SiC MOSFET module. With the ultra-fast gate driver integrated with the SiC MOSFET, the parasitic inductance and capacitance could be reduced dramatically, which accordingly suppress the EMI problem caused by the parasitic parameters. Thus zero gate resistance could be adopted in the module to further increase the switching speed. The switching performance of the integrated SiC module is shown better than the discrete package device. The switching loss of the SiC MOSFET module is measured by the inverter level measurement and composition method. Zero switching loss could be achieved when the drain current is lower than a critical value. The module has been tested at 1.5MHz and 3.38MHz switching frequency to prove its high speed capability. For isolated topology applications, the impact of high frequency on the power density and efficiency is discussed in this paper.
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