一种简单有效的桥接故障紧凑IDDQ测试集生成方法

Proceedings. 16th IEEE VLSI Test Symposium (Cat. No.98TB100231) Pub Date : 1998-04-26 DOI:10.1109/VTEST.1998.670857

T. Shinogi, T. Hayashi

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引用次数: 15

摘要

本文提出了一种生成紧凑测试集的有效方法，用于组合CMOS电路中桥接故障的IDDQ测试。该方法基于迭代改进法。虽然我们的方法简单易行，但效率很高。大型ISCAS基准电路的实验结果证明了该方法的有效性。

本文章由计算机程序翻译，如有差异，请以英文原文为准。

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A simple and efficient method for generating compact IDDQ test set for bridging faults

This paper presents an efficient method for generating a compact test set for IDDQ testing of bridging faults in combinational CMOS circuits. This method is based on the iterative improvement method. Though our method is simple and easy to implement, it is efficient. Experimental results for large ISCAS benchmark circuits demonstrate its efficiency in comparison with results of previous methods.

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Proceedings. 16th IEEE VLSI Test Symposium (Cat. No.98TB100231)

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