基于新型测试设计(DFT)概念的无线体域网络(WBAN)集成设备频谱掩码符合性检验(IEEE标准802.15.6-2012

A. Oleszczuk, Mohamed Thouabtia, Martin Allinger, Jürgen Röber, R. Weigel
{"title":"基于新型测试设计(DFT)概念的无线体域网络(WBAN)集成设备频谱掩码符合性检验(IEEE标准802.15.6-2012","authors":"A. Oleszczuk, Mohamed Thouabtia, Martin Allinger, Jürgen Röber, R. Weigel","doi":"10.1109/ETS54262.2022.9810455","DOIUrl":null,"url":null,"abstract":"In this paper, we introduce a novel design for test (DFT) concept to check the compliance of wireless-body-area-network devices for medical applications with the spectral mask for IR-UWB and FM-UWB defined in chapter 9.13 of the IEEE Std. 802.15.6-2012. The design enables a fast and repeatable IC-production test solution for medium to high volume testing, which is independent of the tester type and does not need any extra circuitry on a test board / device interface board.","PeriodicalId":334931,"journal":{"name":"2022 IEEE European Test Symposium (ETS)","volume":"53 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2022-05-23","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":"{\"title\":\"Novel Design For Test (DFT) Concept to Check the Spectral Mask Compliance Defined in the IEEE Std. 802.15.6-2012 of Wireless-Body-Area-Network (WBAN) IC-Devices\",\"authors\":\"A. Oleszczuk, Mohamed Thouabtia, Martin Allinger, Jürgen Röber, R. Weigel\",\"doi\":\"10.1109/ETS54262.2022.9810455\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"In this paper, we introduce a novel design for test (DFT) concept to check the compliance of wireless-body-area-network devices for medical applications with the spectral mask for IR-UWB and FM-UWB defined in chapter 9.13 of the IEEE Std. 802.15.6-2012. The design enables a fast and repeatable IC-production test solution for medium to high volume testing, which is independent of the tester type and does not need any extra circuitry on a test board / device interface board.\",\"PeriodicalId\":334931,\"journal\":{\"name\":\"2022 IEEE European Test Symposium (ETS)\",\"volume\":\"53 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2022-05-23\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"0\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"2022 IEEE European Test Symposium (ETS)\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/ETS54262.2022.9810455\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"2022 IEEE European Test Symposium (ETS)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/ETS54262.2022.9810455","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 0

摘要

在本文中,我们引入了一种新的测试设计(DFT)概念,以检查医疗应用的无线体域网络设备是否符合IEEE标准802.15.6-2012第9.13章中定义的IR-UWB和FM-UWB的频谱掩码。该设计为中大批量测试提供了快速、可重复的ic生产测试解决方案,与测试仪类型无关,不需要在测试板/设备接口板上安装任何额外的电路。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
查看原文
分享 分享
微信好友 朋友圈 QQ好友 复制链接
本刊更多论文
Novel Design For Test (DFT) Concept to Check the Spectral Mask Compliance Defined in the IEEE Std. 802.15.6-2012 of Wireless-Body-Area-Network (WBAN) IC-Devices
In this paper, we introduce a novel design for test (DFT) concept to check the compliance of wireless-body-area-network devices for medical applications with the spectral mask for IR-UWB and FM-UWB defined in chapter 9.13 of the IEEE Std. 802.15.6-2012. The design enables a fast and repeatable IC-production test solution for medium to high volume testing, which is independent of the tester type and does not need any extra circuitry on a test board / device interface board.
求助全文
通过发布文献求助,成功后即可免费获取论文全文。 去求助
来源期刊
自引率
0.00%
发文量
0
期刊最新文献
AMS Test Vector Generation using AMS Verification and IEEE P1687.2 X-Masking for In-System Deterministic Test DFX: Exploring the Design Space for Quality ETS 2022 Foreword TaintLock: Preventing IP Theft through Lightweight Dynamic Scan Encryption using Taint Bits*
×
引用
GB/T 7714-2015
复制
MLA
复制
APA
复制
导出至
BibTeX EndNote RefMan NoteFirst NoteExpress
×
×
提示
您的信息不完整,为了账户安全,请先补充。
现在去补充
×
提示
您因"违规操作"
具体请查看互助需知
我知道了
×
提示
现在去查看 取消
×
提示
确定
0
微信
客服QQ
Book学术公众号 扫码关注我们
反馈
×
意见反馈
请填写您的意见或建议
请填写您的手机或邮箱
已复制链接
已复制链接
快去分享给好友吧!
我知道了
×
扫码分享
扫码分享
Book学术官方微信
Book学术文献互助
Book学术文献互助群
群 号:481959085
Book学术
文献互助 智能选刊 最新文献 互助须知 联系我们:info@booksci.cn
Book学术提供免费学术资源搜索服务,方便国内外学者检索中英文文献。致力于提供最便捷和优质的服务体验。
Copyright © 2023 Book学术 All rights reserved.
ghs 京公网安备 11010802042870号 京ICP备2023020795号-1