用于ldmosfet射频放大器封装设计的键合线阵列的电-热-机械响应研究

Jie Tong, G. Zhu, J. Hu, W. Yin, Liang Lin, Liang Zhou
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引用次数: 1

摘要

本文研究了用于设计基于mosfet的横向双扩散射频放大器的键合线阵列的电-热-机械响应。我们首先用错配控制系统和用于准确预测其表面温度的红外显微镜对键合线阵列进行了一系列坚固性测量。此外,采用内部时域有限元求解器模拟键合线阵列的电-热-机械响应,并捕获其最高温度,并与商用模拟器COMSOL进行比较。最后,提出了一种改进的键合线阵列设计,并进行了实验验证,从而获得了均匀的电流和温度分布,从而使LDMOSFET射频放大器的电学性能得到了预期的显著改善。
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Study on electro-thermo-mechanical responses of bonding wires arrays used for the package design of LDMOSFET-based RF Amplifier
This paper presents the study of electro-thermo-mechanical responses of bonding wire arrays used for the design of lateral double-diffused MOSFET-based RF amplifier. We at first show a series of ruggedness measurements of bonding wire arrays with a mismatch control system and an IR microscopy used for accurately predicting their surface temperatures. Further, an in-house time-domain finite element solver is employed for simulating the electro-thermo-mechanical responses of bonding wire arrays and their highest temperatures are captured and validated in comparison with those of commercial simulator COMSOL. Finally, an improved design of the bonding wire array is proposed and validated experimentally so as to get both uniform current and temperature distributions, and therefore, a significant improvement of the electrical performance of LDMOSFET RF PA is achieved as we expected.
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