A. Albanna, Andrew Malburg, M. Anwar, Atul Guta, Nidhi Tiwari
{"title":"Si IGBT与SiC MOSFET的性能比较及器件分析","authors":"A. Albanna, Andrew Malburg, M. Anwar, Atul Guta, Nidhi Tiwari","doi":"10.1109/ITEC.2016.7520242","DOIUrl":null,"url":null,"abstract":"The paper presents the characteristics of the latest commercial 1200V 300A SiC MOSFET module and compares it's performance with Si IGBT with the same rating using experimental results and the saber software environment. Our SiC MOSFET model in SABER gives accurate results across a wide range of temperatures. The results show that the 1200V SiC MOSFET has faster switching speed and significantly less switching loss compared to the Si IGBT. Moreover, the Si IGBT switching loss will increase significantly for higher operation temperature, while the SiC MOSFET switching loss has little variation over different temperatures. This paper will also investigates the stray inductance effect on the gate, drain, and source side and verifies its performance with Si IGBT. The double pulse test circuit has been implemented in SABER to simulate the dynamic losses and a brief review of the various applications for automotive industry of the SiC MOSFET has been also presented in the paper.","PeriodicalId":280676,"journal":{"name":"2016 IEEE Transportation Electrification Conference and Expo (ITEC)","volume":"9 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2016-06-27","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"18","resultStr":"{\"title\":\"Performance comparison and device analysis Between Si IGBT and SiC MOSFET\",\"authors\":\"A. Albanna, Andrew Malburg, M. Anwar, Atul Guta, Nidhi Tiwari\",\"doi\":\"10.1109/ITEC.2016.7520242\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"The paper presents the characteristics of the latest commercial 1200V 300A SiC MOSFET module and compares it's performance with Si IGBT with the same rating using experimental results and the saber software environment. Our SiC MOSFET model in SABER gives accurate results across a wide range of temperatures. The results show that the 1200V SiC MOSFET has faster switching speed and significantly less switching loss compared to the Si IGBT. Moreover, the Si IGBT switching loss will increase significantly for higher operation temperature, while the SiC MOSFET switching loss has little variation over different temperatures. This paper will also investigates the stray inductance effect on the gate, drain, and source side and verifies its performance with Si IGBT. The double pulse test circuit has been implemented in SABER to simulate the dynamic losses and a brief review of the various applications for automotive industry of the SiC MOSFET has been also presented in the paper.\",\"PeriodicalId\":280676,\"journal\":{\"name\":\"2016 IEEE Transportation Electrification Conference and Expo (ITEC)\",\"volume\":\"9 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2016-06-27\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"18\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"2016 IEEE Transportation Electrification Conference and Expo (ITEC)\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/ITEC.2016.7520242\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"2016 IEEE Transportation Electrification Conference and Expo (ITEC)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/ITEC.2016.7520242","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 18
摘要
本文介绍了最新商用1200V 300A SiC MOSFET模块的特点,并利用实验结果和saber软件环境将其性能与相同额定值的Si IGBT进行了比较。我们在SABER中的SiC MOSFET模型在广泛的温度范围内提供准确的结果。结果表明,与Si IGBT相比,1200V SiC MOSFET具有更快的开关速度和更小的开关损耗。此外,Si IGBT的开关损耗在较高的工作温度下会显著增加,而SiC MOSFET的开关损耗在不同温度下变化不大。本文还将研究杂散电感对栅极、漏极和源侧的影响,并用Si IGBT验证其性能。在SABER中实现了双脉冲测试电路来模拟动态损耗,并简要介绍了SiC MOSFET在汽车工业中的各种应用。
Performance comparison and device analysis Between Si IGBT and SiC MOSFET
The paper presents the characteristics of the latest commercial 1200V 300A SiC MOSFET module and compares it's performance with Si IGBT with the same rating using experimental results and the saber software environment. Our SiC MOSFET model in SABER gives accurate results across a wide range of temperatures. The results show that the 1200V SiC MOSFET has faster switching speed and significantly less switching loss compared to the Si IGBT. Moreover, the Si IGBT switching loss will increase significantly for higher operation temperature, while the SiC MOSFET switching loss has little variation over different temperatures. This paper will also investigates the stray inductance effect on the gate, drain, and source side and verifies its performance with Si IGBT. The double pulse test circuit has been implemented in SABER to simulate the dynamic losses and a brief review of the various applications for automotive industry of the SiC MOSFET has been also presented in the paper.