静电放电引起的自旋阀记录磁头基线爆裂

Electrical Overstress/Electrostatic Discharge Symposium Proceedings 2000 (IEEE Cat. No.00TH8476) Pub Date : 2000-09-26 DOI:10.1109/EOSESD.2000.890100

Yong Shen, R. Leung, J.Z.F. Sun

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引用次数: 12

摘要

本文报道了一种由机器模型ESD引起的自旋阀(SV)磁记录磁头基线爆裂(BLP)的新机制，该机制具有瞬态时间短(10-20 ns)和峰值电流高(25-35 mA)的特点。该现象所需的能量仅为0.2-0.3 nJ，明显低于人体模型(HBM) ESD诱导的钉住层反转所需的能量(Takahashi et al.， 1998)。我们的数据表明，这种磁不稳定性是由轨道边缘附近永磁层磁化状态的变化引起的，可以通过磁场重新初始化来消除。

本文章由计算机程序翻译，如有差异，请以英文原文为准。

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Baseline popping of spin-valve recording heads induced by ESD

We report a novel mechanism of baseline popping (BLP) of spin-valve (SV) magnetic recording heads induced by machine model (MM) ESD, which is characterized by short transient time (10-20 ns) and high peak current (25-35 mA). Energy required for the phenomenon is just 0.2-0.3 nJ which is significantly less than that required for pinned layer reversal induced by human body model (HBM) ESD (Takahashi et al., 1998). Our data shows that this magnetic instability is caused by a change in the magnetization state of the permanent magnetic layer near track edges and can be eliminated by magnetic field re-initialization.

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Electrical Overstress/Electrostatic Discharge Symposium Proceedings 2000 (IEEE Cat. No.00TH8476)

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