{"title":"使用转换的可测试性合成","authors":"M. Potkonjak, S. Dey, R. Roy","doi":"10.1109/ASPDAC.1995.486360","DOIUrl":null,"url":null,"abstract":"We address the problem of transforming a behavioral specification so that synthesis of a testable implementation from the new specification requires significantly less area and partial scan cost than synthesis from the original specification. A two-stage objective function, that estimates the area and testability of the final implementation, and also captures enabling effects of the transformations, is developed. Optimization is done using a new randomized branch and bound steepest descent algorithm. Application of the transformation algorithm on several examples demonstrates significant simultaneous improvement in both area and testability of the final implementations.","PeriodicalId":119232,"journal":{"name":"Proceedings of ASP-DAC'95/CHDL'95/VLSI'95 with EDA Technofair","volume":"1 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"1995-08-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"8","resultStr":"{\"title\":\"Synthesis-for-testability using transformations\",\"authors\":\"M. Potkonjak, S. Dey, R. Roy\",\"doi\":\"10.1109/ASPDAC.1995.486360\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"We address the problem of transforming a behavioral specification so that synthesis of a testable implementation from the new specification requires significantly less area and partial scan cost than synthesis from the original specification. A two-stage objective function, that estimates the area and testability of the final implementation, and also captures enabling effects of the transformations, is developed. Optimization is done using a new randomized branch and bound steepest descent algorithm. Application of the transformation algorithm on several examples demonstrates significant simultaneous improvement in both area and testability of the final implementations.\",\"PeriodicalId\":119232,\"journal\":{\"name\":\"Proceedings of ASP-DAC'95/CHDL'95/VLSI'95 with EDA Technofair\",\"volume\":\"1 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"1995-08-01\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"8\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"Proceedings of ASP-DAC'95/CHDL'95/VLSI'95 with EDA Technofair\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/ASPDAC.1995.486360\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"Proceedings of ASP-DAC'95/CHDL'95/VLSI'95 with EDA Technofair","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/ASPDAC.1995.486360","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
We address the problem of transforming a behavioral specification so that synthesis of a testable implementation from the new specification requires significantly less area and partial scan cost than synthesis from the original specification. A two-stage objective function, that estimates the area and testability of the final implementation, and also captures enabling effects of the transformations, is developed. Optimization is done using a new randomized branch and bound steepest descent algorithm. Application of the transformation algorithm on several examples demonstrates significant simultaneous improvement in both area and testability of the final implementations.