{"title":"ITC印度2020计划委员会","authors":"Neeraj Bhardwaj","doi":"10.1109/itcindia49857.2020.9171782","DOIUrl":null,"url":null,"abstract":"Bikash Agarwal AMD Dimple Agarwal QUALCOMM Satyadev Ahlawat Indian Institute of Technology (IIT) Jammu Sriram Anandakumar Nvidia Ashok Anbalan Qualcomm India Pvt Ltd Swapnil Bahl Intel Kaushik Balamukundhan Google Inc N.B. Balamurugan Lecturer, ECE Department, Thiagarajar College of Engineering, Madurai-15 Karthi Balasubramanian Amrita Vishwa Vidyapeetham Lakshmanan Balasubramanian Texas Instruments (India) Pvt. Ltd. Hardik Bhagat Marvell Semiconductor India Pvt. Ltd. Neeraj Bhardwaj Texas Instruments Navin Bishnoi Marvell India Pvt Ltd Abhishek Chaudhary Rambus Chip Technologies India Pvt. Ltd. Sameer Chillarige Cadence Narendara D Philemon Daniel NIT Scott Davidson ITC Abhinay Didwania AMD INDIA PVT LTD Nikhil Garg Qualcomm Rajesh Gottumukkala Google India Pvt Ltd Arvind Jain Qualcomm India Private Limited Maheedhar Jalasutaram Google Madhu Julapati Qualcomm Kushal Kamal Marvell India Pvt Ltd Rajit Karmakar IIT Kharagpur Amanulla Khan nVidia Rajesh Khurana Cadence Design Systems Subhadip Kundu Synopsys Vikram Kuralla Invecas Anil Malik CADENCE DESIGN SYSTEMS (I) Pvt Ltd. Gaurav Mittal Texas Instruments Ganesh Murugesan Marvell Semiconductors Bharath Nandakumar Cadence Design Systems Nikita Naresh Texas Instruments India Veejaye Panayadian qualcomm Kamlesh Pandey Broadcom Limited Mayank Parasrampuria Google Wilson Pradeep Texas Instruments Ajay Prajapati Google Narayanan Prakash Texas Instruments Krishnamachary Prathapuram Juniper Krishna Rajan NVIDIA Venkata Rangam Totakura Cypress Semiconductors Sree Ranjani Indian Institute of Technology Madras","PeriodicalId":346727,"journal":{"name":"2020 IEEE International Test Conference India","volume":"1 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2020-07-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":"{\"title\":\"ITC India 2020 Program Committee\",\"authors\":\"Neeraj Bhardwaj\",\"doi\":\"10.1109/itcindia49857.2020.9171782\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"Bikash Agarwal AMD Dimple Agarwal QUALCOMM Satyadev Ahlawat Indian Institute of Technology (IIT) Jammu Sriram Anandakumar Nvidia Ashok Anbalan Qualcomm India Pvt Ltd Swapnil Bahl Intel Kaushik Balamukundhan Google Inc N.B. Balamurugan Lecturer, ECE Department, Thiagarajar College of Engineering, Madurai-15 Karthi Balasubramanian Amrita Vishwa Vidyapeetham Lakshmanan Balasubramanian Texas Instruments (India) Pvt. Ltd. Hardik Bhagat Marvell Semiconductor India Pvt. Ltd. Neeraj Bhardwaj Texas Instruments Navin Bishnoi Marvell India Pvt Ltd Abhishek Chaudhary Rambus Chip Technologies India Pvt. Ltd. Sameer Chillarige Cadence Narendara D Philemon Daniel NIT Scott Davidson ITC Abhinay Didwania AMD INDIA PVT LTD Nikhil Garg Qualcomm Rajesh Gottumukkala Google India Pvt Ltd Arvind Jain Qualcomm India Private Limited Maheedhar Jalasutaram Google Madhu Julapati Qualcomm Kushal Kamal Marvell India Pvt Ltd Rajit Karmakar IIT Kharagpur Amanulla Khan nVidia Rajesh Khurana Cadence Design Systems Subhadip Kundu Synopsys Vikram Kuralla Invecas Anil Malik CADENCE DESIGN SYSTEMS (I) Pvt Ltd. Gaurav Mittal Texas Instruments Ganesh Murugesan Marvell Semiconductors Bharath Nandakumar Cadence Design Systems Nikita Naresh Texas Instruments India Veejaye Panayadian qualcomm Kamlesh Pandey Broadcom Limited Mayank Parasrampuria Google Wilson Pradeep Texas Instruments Ajay Prajapati Google Narayanan Prakash Texas Instruments Krishnamachary Prathapuram Juniper Krishna Rajan NVIDIA Venkata Rangam Totakura Cypress Semiconductors Sree Ranjani Indian Institute of Technology Madras\",\"PeriodicalId\":346727,\"journal\":{\"name\":\"2020 IEEE International Test Conference India\",\"volume\":\"1 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2020-07-01\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"0\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"2020 IEEE International Test Conference India\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/itcindia49857.2020.9171782\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"2020 IEEE International Test Conference India","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/itcindia49857.2020.9171782","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
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